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Déniz Suárez,Oscar ; Castrillon, M. ; Hernández, M. Issued date: 2003 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 24 (13), p. 2153-2157, (Septiembre 2003) JCR: 0,809 - Q3 SCIE Artículo
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Gomez, Luis ; Wachs, J. P.; Jacobo-Berlles, Julio Issued date: 2014 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 36, p. 187-188 SJR: 0,797 - Q1 JCR: 1,551 - Q2 SCIE Comentario
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Travieso, Carlos M. ; Del Pozo-Banos, Marcos; Alonso, Jesus B. Issued date: 2014 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 36, p. 254-260 SJR: 0,797 - Q1 JCR: 1,551 - Q2 SCIE Artículo
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Alemán-Flores, Miguel ; Alvarez, Luis ; Gomez, Luis ; Santana-Cedrés, Daniel Issued date: 2014 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 36, p. 261-271 SJR: 0,797 - Q1 JCR: 1,551 - Q2 SCIE Artículo
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Buemi, Maria Elena; Frery, Alejandro C. ; Ramos, Heitor S. Issued date: 2014 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 36, p. 281-287 SJR: 0,797 - Q1 JCR: 1,551 - Q2 SCIE Artículo
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Sánchez, Javier ; Salgado de la Nuez, Agustín Javier ; Monzón, Nelson Issued date: 2015 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 52, p. 32-39 SJR: 0,976 - Q1 JCR: 1,586 - Q2 SCIE Artículo
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Morales, Aythami; Ferrer, Miguel A. ; Cappelli, Raffaele; Maltoni, Davide; Fierrez, Julian, et al Issued date: 2015 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 68, p. 183-189 SJR: 0,976 - Q1 JCR: 1,586 - Q2 SCIE Artículo
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Das, A.; Pal, U.; Ferrer, Miguel Angel ; Blumenstein, M. Issued date: 2016 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 82, p. 232-241 SJR: 0,82 - Q1 JCR: 1,995 - Q2 SCIE Artículo
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Castrillón Santana, Modesto Fernando ; Lorenzo Navarro, José Javier ; De Ramón Balmaseda, Enrique José Issued date: 2016 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 82, p. 181-189 SJR: 0,82 - Q1 JCR: 1,995 - Q2 SCIE Artículo
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Aginako, Naiara; Castrillón-Santana, Modesto ; Lorenzo-Navarro, Javier ; Martínez-Otzeta, José María; Sierra, Basilio Issued date: 2017 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 91, p. 52-59 SJR: 0,662 - Q1 JCR: 1,954 - Q2 SCIE Artículo
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Freire-Obregón, David ; Narducci, Fabio; Barra, Silvio; Castrillón-Santana, Modesto Issued date: 2017 Source: Pattern Recognition Letters [ISSN 0167-8655], v.126, p. 86-91 (2019) SJR: 0,662 - Q1 JCR: 1,954 - Q2 SCIE Artículo
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Castrillón-Santana, Modesto ; Lorenzo-Navarro, Javier ; Travieso-González, Carlos M. ; Freire-Obregón, David ; Alonso-Hernández, Jesús B. Issued date: 2018 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 113, p. 10-18 SJR: 0,662 - Q1 JCR: 2,81 - Q2 SCIE Artículo
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Diaz, Moises ; Ferrer, Miguel Angel ; Impedovo, Donato; Pirlo, Giuseppe; Vessio, Gennaro Issued date: 2019 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 128, p. 204-210 SJR: 0,848 - Q1 JCR: 3,255 - Q2 SCIE Artículo
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Parziale, Antonio; Diaz, Moises ; Ferrer, Miguel A. ; Marcelli, Angelo Issued date: 2019 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 121, p. 113-122, (Abril 2019) SJR: 0,848 - Q1 JCR: 3,255 - Q2 SCIE Artículo
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Peñate Sánchez, Adrián ; Freire Obregón, David Sebastián ; Lorenzo-Melián, Adrián; Lorenzo Navarro, José Javier ; Castrillón Santana, Modesto Fernando Issued date: 2020 Source: Pattern Recognition Letters [0167-8655], v. 138 (october), p. 355-361 SJR: 0,669 - Q1 JCR: 3,756 - Q2 SCIE Artículo
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Freire Obregón, David Sebastián ; Rosales-Santana, Kevin; Marín Reyes, Pedro Antonio ; Peñate Sánchez, Adrián ; Lorenzo Navarro, José Javier , et al Issued date: 2021 Source: Pattern Recognition Letters, [ISSN 0167-8655] v. 149, p. 179-184, (September 2021) SJR: 1,479 - Q1 JCR: 4,757 - Q2 SCIE MIAR ICDS: 11,0 Artículo
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Ricciardi, Stefano; Castrillón Santana, Modesto Issued date: 2022 Source: Pattern Recognition Letters [ISSN 0167-8655] ,v. 159, p. 211-212, (Julio 2022) SJR: 1,302 - Q1 JCR: 5,1 - Q2 SCIE MIAR ICDS: 11,0 Comentario
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Freire Obregón, David Sebastián ; De Marsico, Maria; Barra, Paola; Lorenzo Navarro, José Javier ; Castrillón Santana, Modesto Fernando Issued date: 2023 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 166, p. 143-150, (Febrero 2023) SJR: 1,4 - Q1 JCR: 5,1 - Q2 SCIE MIAR ICDS: 11,0 Artículo
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Ferrer Ballester, Miguel Ángel ; Díaz Cabrera, Moisés ; Quintana Hernández, José Juan ; Carmona Duarte, María Cristina ; Plamondon, Réjean Issued date: 2023 Source: Pattern Recognition Letters [ISSN 0167-8655], v. 167, p. 181-188, (Marzo 2023) SJR: 1,4 - Q1 JCR: 5,1 - Q2 SCIE MIAR ICDS: 11,0 Artículo
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Abate, Andrea F.; Cimmino, Lucia; Lorenzo-Navarro, Javier Issued date: 2023 Source: Pattern Recognition Letters[ISSN 0167-8655],v. 173, p. 45-49, (Septiembre 2023) SJR: 1,4 - Q1 JCR: 5,1 - Q2 SCIE MIAR ICDS: 11,0 Artículo
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