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Marchan-Hernandez, J. F.; Valencia, E.; Rodriguez-Alvarez, N.; Ramos-Perez, I.; Bosch-Lluis, X., et al Issued date: 2010 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 7 (5440913), p. 621-625 SJR: 1,197 - Q1 JCR: 1,431 - Q2 SCIE Artículo |
Dopido, Inmaculada ; Zortea, Maciel; Villa, Alberto; Plaza, Antonio; Gamba, Paolo Issued date: 2011 Source: Ieee Geoscience And Remote Sensing Letters[ISSN 1545-598X],v. 8 (4), p. 760-764 SJR: 1,385 - Q1 JCR: 1,56 - Q2 SCIE Artículo |
Gomez, Luis ; Munteanu, Cristian; Jacobo-Berlles, Julio; Mejail, Marta Issued date: 2011 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 8 (5738659), p. 814-818 SJR: 1,385 - Q1 JCR: 1,56 - Q2 SCIE Artículo |
Lopez, Sebastian ; Horstrand, Pablo; Callico, Gustavo M. ; López, José Fco ; Sarmiento, Roberto Issued date: 2012 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 9 (6082371), p. 502-506 SJR: 1,213 - Q1 JCR: 1,823 - Q1 SCIE Artículo |
Calderero, Felipe; Eugenio, Francisco ; Marcello, Javier ; Marques, Ferran Issued date: 2012 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 9 (6177220), p. 1012-1016 SJR: 1,213 - Q1 JCR: 1,823 - Q1 SCIE Artículo |
Lopez, Sebastian ; Moure, Javier F.; Plaza, Antonio; Callico, Gustavo M. ; López, José Fco , et al Issued date: 2013 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 10 (6416920), p. 1070-1074 SJR: 1,443 - Q1 JCR: 1,809 - Q2 SCIE Artículo |
Marcello, Javier ; Medina, A; Eugenio, F. Issued date: 2013 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 10 (6265363), p. 432-436 SJR: 1,443 - Q1 JCR: 1,809 - Q2 SCIE Artículo |
Bernabe, Sergio; Lopez, Sebastián ; Plaza, Antonio; Sarmiento, Roberto Issued date: 2013 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 10 (6218752), p. 221-225 SJR: 1,443 - Q1 JCR: 1,809 - Q2 SCIE Artículo |
Frery, Alejandro C. Issued date: 2015 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 12 (7055860), p. 1167-1169 SJR: 1,508 - Q1 JCR: 2,228 - Q1 SCIE Artículo |
Frery, Alejandro C. Issued date: 2018 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 15 (8571361), p. 1805-1806 SJR: 1,518 - Q1 JCR: 3,534 - Q1 SCIE Comentario |
Ratha, Debanshu; Bhattacharya, Avik; Frery, Alejandro C. Issued date: 2018 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X],v. 15 (A23), p. 151-155 SJR: 1,518 - Q1 JCR: 3,534 - Q1 SCIE Artículo |
Santana Cedres, Daniel Elias ; Gómez Déniz, Luis ; Trujillo Pino, Agustín Rafael ; Alemán Flores, Miguel ; Deriche, Rachid, et al Issued date: 2019 Source: IEEE Geoscience and Remote Sensing Letters [ISSN 1545-598X], v. 16(7), p. 1165-1169 SJR: 1,497 - Q1 JCR: 3,833 - Q1 SCIE Artículo |
Santana Cedres, Daniel Elias ; Gomez, Luis ; Alvarez, Luis ; Frery, Alejandro C. Issued date: 2020 Source: IEEE Geoscience And Remote Sensing Letters [ISSN 1545-598X], v. 17 (2), p. 357-361, (Febrero 2020) SJR: 1,372 - Q1 JCR: 3,966 - Q1 SCIE Artículo |
Barrios Alfaro, Yubal ; Guerra Hernández, Raúl Celestino ; López Suárez, Sebastián ; Sarmiento Rodríguez, Roberto Issued date: 2021 Source: IEEE Geoscience and Remote Sensing Letters [ISSN 1545-598X], n. 19 SJR: 1,403 - Q1 JCR: 5,343 - Q1 SCIE MIAR ICDS: 10,7 Artículo |
Kuck, TN; Gómez Déniz, Luis ; Sano, EE; Bispo, PD; Honorio, DDC Issued date: 2021 Source: IEEE Geoscience and Remote Sensing Letters [ISSN 1545-598X], n. 19 SJR: 1,403 - Q1 JCR: 5,343 - Q1 SCIE MIAR ICDS: 10,7 Artículo |
Sanchez Clemente, A. J. ; Blanes, Ian; Barrios Alfaro, Yubal ; Hernandez-Cabronero, Miguel; Bartrina-Rapesta, Joan, et al Issued date: 2022 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X], (Enero 2022) SJR: 1,284 - Q1 JCR: 4,8 - Q1 SCIE MIAR ICDS: 10,7 Artículo |
Melian, Jose; Diaz, Maria ; Morales, Alejandro ; Guerra, Raul ; Lopez, Sebastian , et al Issued date: 2022 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X], (Enero 2022) SJR: 1,284 - Q1 JCR: 4,8 - Q1 SCIE MIAR ICDS: 10,7 Artículo |
Pérez García, Ámbar ; Paoletti, Mercedes E.; Haut, Juan M.; López Feliciano, José Francisco Issued date: 2023 SJR: 1,248 - Q1 JCR: 4,8 - Q1 SCIE MIAR ICDS: 10,7 |
Vasquez Salazar, Ruben Dario ; Cardona Mesa, Ahmed Alejandro ; Gómez Déniz, Luis ; Travieso González, Carlos Manuel Issued date: 2024 Source: IEEE Geoscience and Remote Sensing Letters [ISSN 1545-598X], (Enero 2024) SJR: 1,248 - Q1 JCR: 4,8 - Q1 SCIE MIAR ICDS: 10,7 Artículo |
Barrios Alfaro,Yubal ; Bartrina-Rapestà, Joan; Hernández-Cabronero, Miguel; Sánchez Clemente, Antonio José ; Blanes, Ian, et al Issued date: 2024 Source: Ieee Geoscience And Remote Sensing Letters[ISSN 1545-598X],v. 21, (2024) SJR: 1,248 - Q1 JCR: 4,8 - Q1 SCIE MIAR ICDS: 10,7 Artículo |