Identificador persistente para citar o vincular este elemento:
http://hdl.handle.net/10553/46915
Título: | An advanced drain current model for DGMOSFETs including self-heating effects | Autores/as: | González, B. Íñiguez, B. Lázaro, A. Roldán, J. B. Roldán, A. M. Cerdeira, A. |
Clasificación UNESCO: | 3307 Tecnología electrónica | Palabras clave: | Thermal resistance Thermal conductivity Integrated circuit modeling Silicon Logic gates |
Fecha de publicación: | 2012 | Conferencia: | 2012 8th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2012 | Resumen: | An advanced drain current model for symmetrical Double-Gate MOSFETs (DGMOSFETs), including short channel, velocity saturation and self-heating effects, is presented. The temperature dependence of the low-field mobility, saturation velocity and inversion charge is analyzed and accurately included in the model. Self-heating is considered through the thermal resistance of the device, which is estimated in two ways: from an equivalent thermal circuit and from numerical output characteristic curves, obtained with a commercial TCAD tool (Sentaurus by Synopsys), and fitted with a drain current model. The validity of the model is checked by comparing with simulation results, for the typical bias range used in integrated circuits. | URI: | http://hdl.handle.net/10553/46915 | ISBN: | 9781457711169 | DOI: | 10.1109/ICCDCS.2012.6188909 | Fuente: | 2012 8th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2012 (6188909) |
Colección: | Actas de congresos |
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