Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/42743
Title: Monitoring small defects on surface microstructures through backscattering measurements
Authors: Albella Echave, Pablo 
Moreno, F.
Saiz, J. M.
González, F.
Issue Date: 2006
Journal: Optics Letters 
Abstract: The detection and characterization of small defects on particles or structures of a size comparable with the incident wavelength and located on flat substrates is numerically analyzed. For metallic scattering systems, calculations based on the extinction theorem of physical optics show that geometrical information about a small Gaussian defect can be obtained by partially integrating the backscattering patterns.
URI: http://hdl.handle.net/10553/42743
ISSN: 0146-9592
DOI: 10.1364/OL.31.001744
Source: Optics Letters [ISSN 0146-9592], v. 31, p. 1744-1746, (2006)
Appears in Collections:Artículos
Show full item record

SCOPUSTM   
Citations

4
checked on Mar 30, 2025

WEB OF SCIENCETM
Citations

4
checked on Mar 30, 2025

Page view(s)

61
checked on Jun 22, 2024

Google ScholarTM

Check

Altmetric


Share



Export metadata



Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.