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dc.contributor.authorAlbella Echave, Pabloen_US
dc.contributor.authorMoreno, F.en_US
dc.contributor.authorSaiz, J. M.en_US
dc.contributor.authorGonzález, F.en_US
dc.date.accessioned2018-11-21T10:55:05Z-
dc.date.available2018-11-21T10:55:05Z-
dc.date.issued2006en_US
dc.identifier.issn0146-9592en_US
dc.identifier.urihttp://hdl.handle.net/10553/42743-
dc.description.abstractThe detection and characterization of small defects on particles or structures of a size comparable with the incident wavelength and located on flat substrates is numerically analyzed. For metallic scattering systems, calculations based on the extinction theorem of physical optics show that geometrical information about a small Gaussian defect can be obtained by partially integrating the backscattering patterns.en_US
dc.languageengen_US
dc.relation.ispartofOptics Lettersen_US
dc.sourceOptics Letters [ISSN 0146-9592], v. 31, p. 1744-1746, (2006)en_US
dc.titleMonitoring small defects on surface microstructures through backscattering measurementsen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OL.31.001744en_US
dc.identifier.scopus33745760055-
dc.contributor.authorscopusid14032984700-
dc.contributor.authorscopusid56251147800-
dc.contributor.authorscopusid7005152258-
dc.contributor.authorscopusid56034341000-
dc.description.lastpage1746en_US
dc.description.firstpage1744en_US
dc.relation.volume31en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionSíen_US
dc.identifier.ulpgcSíen_US
dc.description.jcr3,598-
dc.description.jcrqQ1-
dc.description.scieSCIE-
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.orcid0000-0001-7531-7828-
crisitem.author.fullNameAlbella Echave, Pablo-
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