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http://hdl.handle.net/10553/51589
| Title: | Resonant Raman scattering study of InSb etched by reactive ion beam etching | Authors: | Sendra, J. R. Armelles, G. Utzmeier, T. Anguita, J. Briones, F. |
Issue Date: | 1996 | Publisher: | 0021-8979 | Journal: | Journal of Applied Physics | URI: | http://hdl.handle.net/10553/51589 | ISSN: | 0021-8979 | DOI: | 10.1063/1.362472 | Source: | Journal of Applied Physics[ISSN 0021-8979],v. 79, p. 8853-8855 |
| Appears in Collections: | Artículos |
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