Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/129894
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dc.contributor.authorTrujillo Pino, Agustín Rafaelen_US
dc.contributor.authorSuárez Rivero, José Pabloen_US
dc.contributor.authorPadrón Medina, Miguel Ángelen_US
dc.date.accessioned2024-04-17T19:20:50Z-
dc.date.available2024-04-17T19:20:50Z-
dc.date.issued2024en_US
dc.identifier.issn0096-3003en_US
dc.identifier.urihttp://hdl.handle.net/10553/129894-
dc.description.abstractIn 1983 Adler [1] pointed out that if a tetrahedron is nearly equilateral (edge lengths within 5% of each other) and the first and second longest edges are opposite, then the iterative Longest Edge Bisection (LEB) method produces ≤37 similarity classes. The importance of nearly equilateral tetrahedra is that they generate a finite number of similarity classes during the iterative LEB, a desirable property in Finite Element computations. We prove the conjecture given by Adler and improve the bound of 5% to 22.47%. A new algorithm is introduced for the computation of similarity classes in the iterative Longest Edge Bisection (SCLEB) of tetrahedra using a compact and efficient edge-based data structure.en_US
dc.languageengen_US
dc.relation.ispartofApplied Mathematics and Computationen_US
dc.sourceApplied Mathematics and Computation [ISSN 0096-3003], v. 472, 128631, (Julio 2024)en_US
dc.subject1204 Geometríaen_US
dc.subject.otherLongest Edge Bisectionen_US
dc.subject.otherMeshesen_US
dc.subject.otherSimilarity classesen_US
dc.subject.otherTetrahedraen_US
dc.titleFinite number of similarity classes in Longest Edge Bisection of nearly equilateral tetrahedraen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.rights.licenseBY-NC-
dc.identifier.doi10.1016/j.amc.2024.128631en_US
dc.identifier.scopus2-s2.0-85186535087-
dc.contributor.orcid0000-0001-6212-5317-
dc.contributor.orcid0000-0001-8140-9008-
dc.contributor.orcid0000-0001-5493-3090-
dc.relation.volume472en_US
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.description.numberofpages13en_US
dc.utils.revisionen_US
dc.date.coverdateJulio 2024en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-INFen_US
dc.description.sjr1,026-
dc.description.jcr4,0-
dc.description.sjrqQ1-
dc.description.jcrqQ1-
dc.description.scieSCIE-
dc.description.miaricds11,0-
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Informática y Sistemas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.orcid0000-0001-6212-5317-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameTrujillo Pino, Agustín Rafael-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
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