Identificador persistente para citar o vincular este elemento:
http://hdl.handle.net/10553/129894
Campo DC | Valor | idioma |
---|---|---|
dc.contributor.author | Trujillo Pino, Agustín Rafael | en_US |
dc.contributor.author | Suárez Rivero, José Pablo | en_US |
dc.contributor.author | Padrón Medina, Miguel Ángel | en_US |
dc.date.accessioned | 2024-04-17T19:20:50Z | - |
dc.date.available | 2024-04-17T19:20:50Z | - |
dc.date.issued | 2024 | en_US |
dc.identifier.issn | 0096-3003 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/129894 | - |
dc.description.abstract | In 1983 Adler [1] pointed out that if a tetrahedron is nearly equilateral (edge lengths within 5% of each other) and the first and second longest edges are opposite, then the iterative Longest Edge Bisection (LEB) method produces ≤37 similarity classes. The importance of nearly equilateral tetrahedra is that they generate a finite number of similarity classes during the iterative LEB, a desirable property in Finite Element computations. We prove the conjecture given by Adler and improve the bound of 5% to 22.47%. A new algorithm is introduced for the computation of similarity classes in the iterative Longest Edge Bisection (SCLEB) of tetrahedra using a compact and efficient edge-based data structure. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Applied Mathematics and Computation | en_US |
dc.source | Applied Mathematics and Computation [ISSN 0096-3003], v. 472, 128631, (Julio 2024) | en_US |
dc.subject | 1204 Geometría | en_US |
dc.subject.other | Longest Edge Bisection | en_US |
dc.subject.other | Meshes | en_US |
dc.subject.other | Similarity classes | en_US |
dc.subject.other | Tetrahedra | en_US |
dc.title | Finite number of similarity classes in Longest Edge Bisection of nearly equilateral tetrahedra | en_US |
dc.type | info:eu-repo/semantics/article | en_US |
dc.type | Article | en_US |
dc.rights.license | BY-NC | - |
dc.identifier.doi | 10.1016/j.amc.2024.128631 | en_US |
dc.identifier.scopus | 2-s2.0-85186535087 | - |
dc.contributor.orcid | 0000-0001-6212-5317 | - |
dc.contributor.orcid | 0000-0001-8140-9008 | - |
dc.contributor.orcid | 0000-0001-5493-3090 | - |
dc.relation.volume | 472 | en_US |
dc.investigacion | Ciencias | en_US |
dc.type2 | Artículo | en_US |
dc.description.numberofpages | 13 | en_US |
dc.utils.revision | Sí | en_US |
dc.date.coverdate | Julio 2024 | en_US |
dc.identifier.ulpgc | Sí | en_US |
dc.contributor.buulpgc | BU-INF | en_US |
dc.description.sjr | 1,026 | - |
dc.description.jcr | 4,0 | - |
dc.description.sjrq | Q1 | - |
dc.description.jcrq | Q1 | - |
dc.description.scie | SCIE | - |
dc.description.miaricds | 11,0 | - |
item.fulltext | Con texto completo | - |
item.grantfulltext | open | - |
crisitem.author.dept | GIR IUCES: Centro de Tecnologías de la Imagen | - |
crisitem.author.dept | IU de Cibernética, Empresa y Sociedad (IUCES) | - |
crisitem.author.dept | Departamento de Informática y Sistemas | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Cartografía y Expresión Gráfica en La Ingeniería | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Civil | - |
crisitem.author.orcid | 0000-0001-6212-5317 | - |
crisitem.author.orcid | 0000-0001-8140-9008 | - |
crisitem.author.orcid | 0000-0001-5493-3090 | - |
crisitem.author.parentorg | IU de Cibernética, Empresa y Sociedad (IUCES) | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Trujillo Pino, Agustín Rafael | - |
crisitem.author.fullName | Suárez Rivero, José Pablo | - |
crisitem.author.fullName | Padrón Medina, Miguel Ángel | - |
Colección: | Artículos |
Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.