Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/121749
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dc.contributor.authorSánchez Clemente, Antonio Joséen_US
dc.contributor.authorEntrena, L.en_US
dc.contributor.authorGarcia-Valderas, M.en_US
dc.date.accessioned2023-04-10T13:47:13Z-
dc.date.available2023-04-10T13:47:13Z-
dc.date.issued2016en_US
dc.identifier.isbn9781509002313-
dc.identifier.issn0018-9499en_US
dc.identifier.urihttp://hdl.handle.net/10553/121749-
dc.description.abstractTMR is a very effective technique to mitigate SEU effects in FPGAs, but it is often expensive in terms of FPGA resource utilization and power consumption. For certain applications, Partial TMR can be used to trade off the reliability with the cost of mitigation. In this work we propose a new approach to build Partial TMR circuits for FPGAs using approximate logic circuits. This approach is scalable, with a fine granularity, and can provide a flexible balance between reliability and overheads. The proposed approach has been validated by the results of fault injection experiments and proton irradiation campaigns.en_US
dc.languagespaen_US
dc.relation.ispartofIEEE Transactions on Nuclear Scienceen_US
dc.subject330790 Microelectrónicaen_US
dc.subject.otherApproximate circuit | FPGA | selective mitigation | single event upset | triple modular redundancyen_US
dc.titlePartial TMR in FPGAs Using Approximate Logic Circuitsen_US
dc.typeArticleen_US
dc.relation.conferenceEuropean Conference on Radiation and its Effects on Components and Systems, RADECS 2015-
dc.identifier.doi10.1109/TNS.2016.2541700en_US
dc.identifier.scopus2-s2.0-84978289010-
dc.identifier.isiWOS:000382467900034-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.identifier.issue4-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionen_US
dc.identifier.ulpgcNoen_US
dc.contributor.buulpgcBU-TELen_US
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.orcid0000-0002-2142-7885-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSánchez Clemente, Antonio José-
Colección:Artículos
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