Please use this identifier to cite or link to this item:
https://accedacris.ulpgc.es/jspui/handle/10553/121749
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sánchez Clemente, Antonio José | en_US |
| dc.contributor.author | Entrena, L. | en_US |
| dc.contributor.author | Garcia-Valderas, M. | en_US |
| dc.date.accessioned | 2023-04-10T13:47:13Z | - |
| dc.date.available | 2023-04-10T13:47:13Z | - |
| dc.date.issued | 2016 | en_US |
| dc.identifier.isbn | 9781509002313 | - |
| dc.identifier.issn | 0018-9499 | en_US |
| dc.identifier.uri | https://accedacris.ulpgc.es/handle/10553/121749 | - |
| dc.description.abstract | TMR is a very effective technique to mitigate SEU effects in FPGAs, but it is often expensive in terms of FPGA resource utilization and power consumption. For certain applications, Partial TMR can be used to trade off the reliability with the cost of mitigation. In this work we propose a new approach to build Partial TMR circuits for FPGAs using approximate logic circuits. This approach is scalable, with a fine granularity, and can provide a flexible balance between reliability and overheads. The proposed approach has been validated by the results of fault injection experiments and proton irradiation campaigns. | en_US |
| dc.language | spa | en_US |
| dc.relation.ispartof | IEEE Transactions on Nuclear Science | en_US |
| dc.subject | 330790 Microelectrónica | en_US |
| dc.subject.other | Approximate circuit | FPGA | selective mitigation | single event upset | triple modular redundancy | en_US |
| dc.title | Partial TMR in FPGAs Using Approximate Logic Circuits | en_US |
| dc.type | Article | en_US |
| dc.relation.conference | European Conference on Radiation and its Effects on Components and Systems, RADECS 2015 | - |
| dc.identifier.doi | 10.1109/TNS.2016.2541700 | en_US |
| dc.identifier.scopus | 2-s2.0-84978289010 | - |
| dc.identifier.isi | WOS:000382467900034 | - |
| dc.contributor.orcid | #NODATA# | - |
| dc.contributor.orcid | #NODATA# | - |
| dc.contributor.orcid | #NODATA# | - |
| dc.identifier.issue | 4 | - |
| dc.investigacion | Ingeniería y Arquitectura | en_US |
| dc.type2 | Artículo | en_US |
| dc.utils.revision | Sí | en_US |
| dc.identifier.ulpgc | No | en_US |
| dc.contributor.buulpgc | BU-TEL | en_US |
| item.grantfulltext | open | - |
| item.fulltext | Con texto completo | - |
| crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
| crisitem.author.dept | IU de Microelectrónica Aplicada | - |
| crisitem.author.orcid | 0000-0002-2142-7885 | - |
| crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
| crisitem.author.fullName | Sánchez Clemente, Antonio José | - |
| Appears in Collections: | Artículos | |
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