Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/113103
Title: Test set-ups for fast measurement of monolithic integrated circuits from on-wafer to system. Application to a novel GaAs monolithic transimpedance amplifier for high speed optical communication systems
Authors: Dorta-Naranjo, B. Pablo 
Salazar, M.
Casao, J. A.
Cáceres, J. L.
Pérez, J.
UNESCO Clasification: 3325 Tecnología de las telecomunicaciones
Issue Date: 1992
Publisher: European Space Research and Technology Center (ESTEC)
European Space Agency (ESA)
Conference: European Gallium Arsenide and Related III-V Compounds Applications Symposium (GaAs 1992) 
URI: http://hdl.handle.net/10553/113103
Source: Proceedings of GAAS. European Gallium Arsenide and Related III-V Compounds Applications Symposium
Appears in Collections:Actas de congresos
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