Identificador persistente para citar o vincular este elemento:
http://hdl.handle.net/10553/42473
| Título: | Low cost programmable modular system to perform In-Circuit Test (ICT) full development of the hardware, software and mechanics of an ICT machine | Autores/as: | Monagas Martín, Jorge Sarmiento Nevado, Artemi Vega Martínez, Aurelio |
Clasificación UNESCO: | 3325 Tecnología de las telecomunicaciones | Palabras clave: | Communication buses Electronics instrumentation Embedded systems In-circuit test |
Fecha de publicación: | 2016 | Editor/a: | Institute of Electrical and Electronics Engineers (IEEE) | Conferencia: | Conference on Technologies Applied to Electronics Teaching (TAEE) | Resumen: | An In-Circuit Test machine (ICT) is a tool to carry out electrical tests on already assembled printed circuits through a set of probes making contact on some selected circuit nodes to monitorize their electrical signals or to induce electrical states at those nodes. This paper introduces the hardware, software and mechanical development of a low cost modular test system to make In-Circuit Test (ICT) intended for electronic prototypes of small and medium manufacturing series. | URI: | http://hdl.handle.net/10553/42473 | ISBN: | 9781509022649 | DOI: | 10.1109/TAEE.2016.7528359 | Fuente: | Proceedings of 2016 Technologies Applied to Electronics Teaching, TAEE 2016, (Agosto 2016), p. 1-7 |
| Colección: | Actas de congresos |
Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.