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Title: Low cost programmable modular system to perform In-Circuit Test (ICT) full development of the hardware, software and mechanics of an ICT machine
Authors: Monagas Martín, Jorge 
Sarmiento Nevado, Artemi
Vega Martínez, Aurelio 
UNESCO Clasification: 3325 Tecnología de las telecomunicaciones
Keywords: Communication buses
Electronics instrumentation
Embedded systems
In-circuit test
Issue Date: 2016
Publisher: Institute of Electrical and Electronics Engineers (IEEE) 
Conference: Conference on Technologies Applied to Electronics Teaching (TAEE) 
Abstract: An In-Circuit Test machine (ICT) is a tool to carry out electrical tests on already assembled printed circuits through a set of probes making contact on some selected circuit nodes to monitorize their electrical signals or to induce electrical states at those nodes. This paper introduces the hardware, software and mechanical development of a low cost modular test system to make In-Circuit Test (ICT) intended for electronic prototypes of small and medium manufacturing series.
ISBN: 9781509022649
DOI: 10.1109/TAEE.2016.7528359
Source: Proceedings of 2016 Technologies Applied to Electronics Teaching, TAEE 2016, (Agosto 2016), p. 1-7
Appears in Collections:Actas de congresos
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