Low cost programmable modular system to perform In-Circuit Test (ICT) full development of the hardware, software and mechanics of an ICT machine

Título:	Low cost programmable modular system to perform In-Circuit Test (ICT) full development of the hardware, software and mechanics of an ICT machine
Autores/as:	Monagas Martín, Jorge Sarmiento Nevado, Artemi Vega Martínez, Aurelio
Clasificación UNESCO:	3325 Tecnología de las telecomunicaciones
Palabras clave:	Communication buses Electronics instrumentation Embedded systems In-circuit test
Fecha de publicación:	2016
Editor/a:	Institute of Electrical and Electronics Engineers (IEEE)
Conferencia:	Conference on Technologies Applied to Electronics Teaching (TAEE)
Resumen:	An In-Circuit Test machine (ICT) is a tool to carry out electrical tests on already assembled printed circuits through a set of probes making contact on some selected circuit nodes to monitorize their electrical signals or to induce electrical states at those nodes. This paper introduces the hardware, software and mechanical development of a low cost modular test system to make In-Circuit Test (ICT) intended for electronic prototypes of small and medium manufacturing series.
URI:	http://hdl.handle.net/10553/42473
ISBN:	9781509022649
DOI:	10.1109/TAEE.2016.7528359
Fuente:	Proceedings of 2016 Technologies Applied to Electronics Teaching, TAEE 2016, (Agosto 2016), p. 1-7
Colección:	Actas de congresos

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