Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/75544
DC FieldValueLanguage
dc.contributor.authorHelal, Hichamen_US
dc.contributor.authorBenamara, Zineben_US
dc.contributor.authorGonzález Pérez, Benitoen_US
dc.contributor.authorKacha, Arslane Hatemen_US
dc.contributor.authorRabehi, Abdelazizen_US
dc.contributor.authorWederni, M. A.en_US
dc.contributor.authorMourad, Sabrineen_US
dc.contributor.authorKhirouni, Kamelen_US
dc.contributor.authorMonier, Guillaumeen_US
dc.contributor.authorRobert-Goumet, Christineen_US
dc.date.accessioned2020-11-16T08:57:12Z-
dc.date.available2020-11-16T08:57:12Z-
dc.date.issued2020en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/75544-
dc.description.abstractIn this paper, a new model of thermionic emission current for non-ideal Schottky contacts and a method of extracting electrical parameters are presented. The Au/n-GaAs Schottky structure is fabricated and simulated using Silvaco–Atlas software in a wide temperature range. The proposed method shows series resistance Rs values close to those obtained from ln(I)–V method and ideality factor n in good agreement with the reported experimental studies. The barrier height ϕb extracted by our method is in good agreement with those extracted from the band diagram (BD) and capacitance–voltage (C–V) characteristics. It is increased with decreasing temperature, in accordance with the band gap variation with temperature and the reported negative temperature coefficient of the barrier height. Conversely, ϕb obtained from the classical model using ln(I)–V method shows an abnormal behavior and discordance with the ϕb extracted from the band diagram and C–V characteristics. Finally, the proposed model shows identical characteristics with the simulation and the experimental curves, in all temperature range, while the classic model shows large deviations at high bias voltages.en_US
dc.languageengen_US
dc.relation.ispartofEuropean Physical Journal Plusen_US
dc.sourceEuropean Physical Journal Plus[EISSN 2190-5444],v. 135 (11), (Noviembre 2020)en_US
dc.subject2203 Electrónicaen_US
dc.subject.otherthermionic emissionsen_US
dc.subject.otherAu/n-GaAs Schottkyen_US
dc.subject.otherMetal–semiconductor Schottkyen_US
dc.titleA new model of thermionic emission mechanism for non-ideal Schottky contacts and a method of extracting electrical parametersen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1140/epjp/s13360-020-00916-5en_US
dc.identifier.scopus85095721195-
dc.contributor.authorscopusid57201977320-
dc.contributor.authorscopusid6701427384-
dc.contributor.authorscopusid57219836302-
dc.contributor.authorscopusid56998598800-
dc.contributor.authorscopusid56884548300-
dc.contributor.authorscopusid57194707470-
dc.contributor.authorscopusid57208580870-
dc.contributor.authorscopusid6601962761-
dc.contributor.authorscopusid23492825500-
dc.contributor.authorscopusid56122360200-
dc.identifier.eissn2190-5444-
dc.identifier.issue11-
dc.relation.volume135en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionen_US
dc.date.coverdateNoviembre 2020en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr0,65
dc.description.jcr3,911
dc.description.sjrqQ2
dc.description.jcrqQ1
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUMA: Tecnología Microelectrónica-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0001-6864-9736-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameGonzález Pérez, Benito-
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