Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54884
DC FieldValueLanguage
dc.contributor.authorMárquez, Albertoen_US
dc.contributor.authorMoreno-González, Auxiliadoraen_US
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.otherMarquez, Alberto-
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherSuarez, Jose Pablo-
dc.contributor.otherMoreno Gonzalez, Maria Auxiliadora-
dc.date.accessioned2019-02-18T15:24:08Z-
dc.date.available2019-02-18T15:24:08Z-
dc.date.issued2014en_US
dc.identifier.issn0378-4754en_US
dc.identifier.urihttp://hdl.handle.net/10553/54884-
dc.description.abstractA new edge-based partition for triangle meshes is presented, the Seven Triangle Quasi-Delaunay partition (7T-QD). The proposed partition joins together ideas of the Seven Triangle Longest-Edge partition (7T-LE), and the classical criteria for constructing Delaunay meshes. The new partition performs similarly compared to the Delaunay triangulation (7T-D) with the benefit of being more robust and with a cheaper cost in computation. It will be proved that in most of the cases the 7T-QD is equal to the 7T-D. In addition, numerical tests will show that the difference on the minimum angle obtained by the 7T-QD and by the 7T-D is negligible.en_US
dc.languageengen_US
dc.relation.ispartofMathematics and Computers in Simulationen_US
dc.sourceMathematics and Computers in Simulation [ISSN 0378-4754], v. 106, p. 84-94en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherLongest-Side Partition
dc.subject.otherMesh Generation
dc.subject.otherAlgorithms
dc.subject.otherQuality
dc.subject.otherTriangles
dc.subject.otherImprovement
dc.subject.otherSimulation
dc.titleThere are simple and robust refinements (almost) as good as Delaunayen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.matcom.2012.06.001
dc.identifier.scopus85027922097
dc.identifier.isi000345720800006-
dc.contributor.authorscopusid7102678794
dc.contributor.authorscopusid16550374900
dc.contributor.authorscopusid7006613647
dc.contributor.authorscopusid7202040282
dc.description.lastpage94-
dc.description.firstpage84-
dc.relation.volume106-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000345720800006-
dc.contributor.daisngid710426-
dc.contributor.daisngid5156009-
dc.contributor.daisngid259483-
dc.contributor.daisngid1080382-
dc.identifier.investigatorRIDC-6905-2011-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.investigatorRIDNo ID-
dc.identifier.externalWOS:000345720800006-
dc.contributor.wosstandardWOS:Marquez, A
dc.contributor.wosstandardWOS:Moreno-Gonzalez, A
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Suarez, JP
dc.date.coverdateEnero 2014
dc.identifier.ulpgces
dc.description.sjr0,579
dc.description.jcr0,949
dc.description.sjrqQ1
dc.description.jcrqQ2
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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