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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54644
DC FieldValueLanguage
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorFalcón, Sergioen_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.authorAbad, Pilaren_US
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherSuarez, Jose Pablo-
dc.date.accessioned2019-02-18T12:12:06Z-
dc.date.available2019-02-18T12:12:06Z-
dc.date.issued2012en_US
dc.identifier.issn0378-4754en_US
dc.identifier.urihttp://hdl.handle.net/10553/54644-
dc.description.abstractIn this paper we present a local refinement algorithm based on the longest-edge trisection of triangles. Local trisection patterns are used to generate a conforming triangulation, depending on the number of non-conforming nodes per edge presented. We describe the algorithm and provide a study of the efficiency (cost analysis) of the triangulation refinement problem. The algorithm presented, and its associated triangle partition, afford a valid strategy to refine triangular meshes. Some numerical studies are analysed together with examples of applications in the field of mesh refinement.en_US
dc.languageengen_US
dc.relation.ispartofMathematics and Computers in Simulationen_US
dc.sourceMathematics and Computers in Simulation [ISSN 0378-4754], v. 82, p. 2971-2981en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherAdaptive Refinement
dc.subject.otherQuality Improvement
dc.subject.otherPartition
dc.subject.otherBisection
dc.subject.otherSide
dc.subject.otherTriangulations
dc.subject.otherPropagation
dc.subject.otherGeneration
dc.titleA local refinement algorithm for the longest-edge trisection of triangle meshesen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.matcom.2011.07.003
dc.identifier.scopus84868500757-
dc.identifier.isi000311976400008-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid6602997880-
dc.contributor.authorscopusid7202040282-
dc.contributor.authorscopusid57196535626-
dc.description.lastpage2981-
dc.description.firstpage2971-
dc.relation.volume82-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000311976400008-
dc.contributor.daisngid259483-
dc.contributor.daisngid809328-
dc.contributor.daisngid1080382-
dc.contributor.daisngid1500747-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.externalWOS:000311976400008-
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Falcon, S
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Abad, P
dc.date.coverdateAgosto 2012
dc.identifier.ulpgcSíes
dc.description.sjr0,61
dc.description.jcr0,836
dc.description.sjrqQ2
dc.description.jcrqQ2
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-9917-3101-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameFalcón Santana, Sergio-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNameAbad Real, María Pilar-
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