Please use this identifier to cite or link to this item: https://accedacris.ulpgc.es/handle/10553/54355
DC FieldValueLanguage
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.authorPadrón, Miguel A.en_US
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherSuarez, Jose Pablo-
dc.date.accessioned2019-02-18T10:17:18Z-
dc.date.available2019-02-18T10:17:18Z-
dc.date.issued2004en_US
dc.identifier.issn0168-9274en_US
dc.identifier.urihttps://accedacris.ulpgc.es/handle/10553/54355-
dc.description.abstractIn this paper we present lower and upper bounds for the number of equivalence classes of d-triangles with additional or Steiner points. We also study the number of possible partitions that may appear by bisecting a tetrahedron with Steiner points at the midpoints of its edges. This problem arises, for example, when refining a 3D triangulation by bisecting the tetrahedra. To begin with, we look at the analogous 2D case, and then the 1-irregular tetrahedra (tetrahedra with at most one Steiner point on each edge) are classified into equivalence classes, and each element of the class is subdivided into several non-equivalent bisection-based partitions which are also studied. Finally, as an example of the application of refinement and coarsening of 3D bisection-based algorithms, a simulation evolution problem is shown.en_US
dc.languageengen_US
dc.relation.ispartofApplied Numerical Mathematicsen_US
dc.sourceApplied Numerical Mathematics [ISSN 0168-9274], v. 49 (3-4), p. 415-430en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherSteiner pointsen_US
dc.subject.otherTriangulationen_US
dc.subject.otherBisectionen_US
dc.titleNon-equivalent partitions of d-triangles with Steiner pointsen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference1st Meeting on Applied Scientific Computing and Tools
dc.identifier.doi10.1016/j.apnum.2003.12.017
dc.identifier.scopus2342619609-
dc.identifier.isi000221502100013-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid7202040282-
dc.contributor.authorscopusid6603825227-
dc.identifier.eissn1873-5460-
dc.description.lastpage430-
dc.identifier.issue(3-4)-
dc.description.firstpage415-
dc.relation.volume49-
dc.investigacionCienciasen_US
dc.type2Actas de congresosen_US
dc.identifier.wosWOS:000221502100013-
dc.contributor.daisngid259483-
dc.contributor.daisngid1080382-
dc.contributor.daisngid3168114-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.externalWOS:000221502100013-
dc.identifier.externalWOS:000221502100013-
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Padron, MA
dc.date.coverdateJunio 2004
dc.identifier.conferenceidevents120403
dc.identifier.ulpgces
dc.description.jcr0,639
dc.description.jcrqQ2
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
crisitem.event.eventsstartdate22-10-2001-
crisitem.event.eventsenddate24-10-2001-
Appears in Collections:Actas de congresos
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