Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/52553
Campo DC Valoridioma
dc.contributor.authorGomez, Luisen_US
dc.contributor.authorBuemi, María Elenaen_US
dc.contributor.authorJacobo-Berlles, Jacobo C.en_US
dc.contributor.authorMejail, Marta E.en_US
dc.date.accessioned2018-11-30T09:48:50Z-
dc.date.available2018-11-30T09:48:50Z-
dc.date.issued2016en_US
dc.identifier.issn1939-1404en_US
dc.identifier.urihttp://hdl.handle.net/10553/52553-
dc.description.abstractSynthetic aperture radar (SAR) images are corrupted with a multiplicative granular-like noise pattern known as speckle. The goal for a despeckling filter consists of suppressing the speckle while preserving all the scene features such as texture, point-type targets, and, especially, edges. There exist several speckle filtering techniques and a relevant number of image quality indexes to evaluate the performances of a filtering operation on an SAR image. However, assessing the superiority of a filter over other is not a trivial issue. In this work, we present a new referenceless estimator (αβ-ratio estimator) based on the ratio edge detector which allows helping in objectively evaluating a filter realization on SAR images. The proposed estimator operates on the ratio image obtained as the point-to-point ratio between the original image (noisy image) and the filtered image. An ideal filter operation on an image implies that, in areas where speckle is fully developed, the ratio image should have the features of pure speckle and no geometric content. The new estimator measures the remaining geometric content within the ratio image. This new estimator is easy to compute and it provides an excellent metric to rank a filtering operation on real SAR images.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensingen_US
dc.sourceIEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing[ISSN 1939-1404],v. 9 (7208801), p. 1297-1307en_US
dc.subject33 Ciencias tecnológicasen_US
dc.subject.otherImage-quality indexen_US
dc.subject.otherRatio imagesen_US
dc.subject.otherSpeckleen_US
dc.subject.otherSpeckle filteringen_US
dc.subject.otherSynthetic aperture radar (SAR)en_US
dc.titleA new image quality index for objectively evaluating despeckling filtering in SAR imagesen_US
dc.typeinfo:eu-repo/semantics/Articlees
dc.typeArticlees
dc.identifier.doi10.1109/JSTARS.2015.2465167
dc.identifier.scopus84939606460
dc.identifier.isi000373054100027
dc.contributor.authorscopusid56789548300
dc.contributor.authorscopusid8265430800
dc.contributor.authorscopusid6506465261
dc.contributor.authorscopusid6507133054
dc.description.lastpage1307-
dc.identifier.issue3-
dc.description.firstpage1297-
dc.relation.volume9-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid746480
dc.contributor.daisngid2822975
dc.contributor.daisngid1925792
dc.contributor.daisngid795427
dc.contributor.wosstandardWOS:Gomez, L
dc.contributor.wosstandardWOS:Buemi, ME
dc.contributor.wosstandardWOS:Jacobo-Berlles, JC
dc.contributor.wosstandardWOS:Mejail, ME
dc.date.coverdateMarzo 2016
dc.identifier.ulpgces
dc.description.sjr1,427
dc.description.jcr2,913
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.fullNameGómez Déniz, Luis-
Colección:Artículos
miniatura
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