1. accedaCRIS
  2. Publicaciones
  3. Artículos
Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/51589
DC FieldValueLanguage
dc.contributor.authorSendra, J. R.
dc.contributor.authorArmelles, G.
dc.contributor.authorUtzmeier, T.
dc.contributor.authorAnguita, J.
dc.contributor.authorBriones, F.
dc.date.accessioned2018-11-25T01:58:32Z-
dc.date.available2018-11-25T01:58:32Z-
dc.date.issued1996
dc.identifier.issn0021-8979
dc.identifier.urihttp://hdl.handle.net/10553/51589-
dc.publisher0021-8979
dc.relation.ispartofJournal of Applied Physics
dc.sourceJournal of Applied Physics[ISSN 0021-8979],v. 79, p. 8853-8855
dc.titleResonant Raman scattering study of InSb etched by reactive ion beam etching
dc.typeinfo:eu-repo/semantics/articlees
dc.typeArticlees
dc.identifier.doi10.1063/1.362472
dc.identifier.scopus0041544743
dc.contributor.authorscopusid7006497287
dc.contributor.authorscopusid7004103072
dc.contributor.authorscopusid6603959480
dc.contributor.authorscopusid57202568509
dc.contributor.authorscopusid7005186899
dc.description.lastpage8855
dc.description.firstpage8853
dc.relation.volume79
dc.type2Artículoes
dc.identifier.ulpgcSíes
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Equipos y Sistemas de Comunicación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.orcid0000-0001-5385-792X-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSendra Sendra,José Ramón-
Appears in Collections:Artículos
Show simple item record

SCOPUSTM   
Citations

10
checked on Apr 14, 2024

Page view(s)

40
checked on Dec 23, 2023

Google ScholarTM

Check

Altmetric


Share


Export metadata


Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.