Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/49659
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dc.contributor.authorNavarro Botello,Héctoren_US
dc.contributor.authorNooshabadi, Saeiden_US
dc.contributor.authorMontiel- Nelson, Juan A.en_US
dc.contributor.authorNavarro, V.en_US
dc.contributor.authorSosa, J.en_US
dc.contributor.authorGarcia, Jose C.en_US
dc.date.accessioned2018-11-24T09:41:27Z-
dc.date.available2018-11-24T09:41:27Z-
dc.date.issued2009en_US
dc.identifier.isbn9781424429530en_US
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/49659-
dc.description.abstractIn this paper, inequalities of integer hull polyhedrons are used in mixed integer linear programming (MILP) to model the behavior of combinational subsystems, introducing a new solution for the satisfiability (SAT) problem at register transfer level (RTL). Since in these models the vertexes are located at integer positions, they can be used with linear programming (LP) to solve SAT problems. Unfortunately, when combining together several models to make up a compound RTL description, internal vertexes may appear forcing to declare one or more variables as integer. However, the use of these models inside an RTL SAT problem reduces the number of branches needed to solve the whole integer problem. Results show a CPU solution time reduction greater than one order of magnitude, growing with the size of the problem.en_US
dc.languageengen_US
dc.relation.ispartofProceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009en_US
dc.sourceProceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009 (4810306), p. 272-275en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherRegister Transfer Level (RTL)en_US
dc.subject.otherSatisfiability (SAT)en_US
dc.subject.otherDesign Verificationen_US
dc.subject.otherLinear Programmingen_US
dc.subject.otherCutting Planesen_US
dc.titleA geometric approach to register transfer level satisfiabilityen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference10th International Symposium on Quality Electronic Design, ISQED 2009en_US
dc.identifier.doi10.1109/ISQED.2009.4810306en_US
dc.identifier.scopus67649646219-
dc.identifier.isi000268848600046-
dc.contributor.authorscopusid23028289000-
dc.contributor.authorscopusid6602486254-
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid57198264956-
dc.contributor.authorscopusid56231679300-
dc.contributor.authorscopusid9639270900-
dc.description.lastpage275en_US
dc.identifier.issue4810306-
dc.description.firstpage272en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.contributor.daisngid8452012-
dc.contributor.daisngid184255-
dc.contributor.daisngid480589-
dc.contributor.daisngid20061557-
dc.contributor.daisngid1739656-
dc.contributor.daisngid8205808-
dc.description.numberofpages2en_US
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Navarro, H-
dc.contributor.wosstandardWOS:Nooshabadi, S-
dc.contributor.wosstandardWOS:Montiel-Nelson, JA-
dc.contributor.wosstandardWOS:Navarro, V-
dc.contributor.wosstandardWOS:Sosa, J-
dc.contributor.wosstandardWOS:Garcia, JC-
dc.date.coverdateJulio 2009en_US
dc.identifier.conferenceidevents120684-
dc.identifier.ulpgces
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Equipos y Sistemas de Comunicación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.orcid0000-0003-1838-3073-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameNavarro Botello,Héctor-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
crisitem.author.fullNameSosa González, Carlos Javier-
crisitem.author.fullNameGarcía Montesdeoca,José Carlos-
crisitem.event.eventsstartdate16-03-2009-
crisitem.event.eventsenddate18-03-2009-
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