Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/47680
DC FieldValueLanguage
dc.contributor.authorLi, Xiaojieen_US
dc.contributor.authorSong, Changheen_US
dc.contributor.authorLópez, Sebastianen_US
dc.contributor.authorLi, Yunsongen_US
dc.contributor.authorLópez, José F.en_US
dc.date.accessioned2018-11-23T15:31:56Z-
dc.date.available2018-11-23T15:31:56Z-
dc.date.issued2015en_US
dc.identifier.issn0098-3004en_US
dc.identifier.urihttp://hdl.handle.net/10553/47680-
dc.description.abstractSurface roughness is an important factor in bare soil microwave radiation for the observation of the Earth. Correlation length and standard deviation of surface height are the two statistical parameters that describe surface roughness. However, when the number of data points is large, the calculation of surface roughness parameters becomes time-consuming.Therefore, it is desired to have a high-performance computing facility to execute this task. A Graphics Processing Unit (GPU) provides hundreds of computing cores along with a high memory bandwidth. To carry out a parallel implementation of the algorithms, Compute Unified Device Architecture (CUDA) provides researchers with an easy way to execute multiple threads in parallel on GPUs. In this paper, we propose a GPU-based parallel computing method for 2D surface roughness estimation. We use an NVIDIA GeForce GTX 590 graphics card to run the CUDA implementation. The experimental input data is collected by our in-house surface roughness tester which is designed based on the laser triangulation principle, giving sample data points of up to 52,040. According to the experimental results, the serial CPU version of the implementation takes 5422 s whereas our GPU implementation takes only 47 s, resulting a significant 115 x speedup. (C) 2015 Elsevier Ltd. All rights reserved.en_US
dc.languageengen_US
dc.publisher0098-3004-
dc.relation.ispartofComputers and Geosciencesen_US
dc.sourceComputers and Geosciences[ISSN 0098-3004],v. 82, p. 38-44en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherParameteren_US
dc.subject.otherMoistureen_US
dc.subject.otherBare soil surface roughnessen_US
dc.subject.otherCorrelation lengthen_US
dc.subject.otherGraphics Proccessing Uniten_US
dc.titleFast computation of bare soil surface roughness on a Fermi GPUen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.cageo.2015.05.013en_US
dc.identifier.scopus84930939953-
dc.identifier.isi000358971500005-
dc.contributor.authorscopusid56681754200-
dc.contributor.authorscopusid49662159100-
dc.contributor.authorscopusid57187722000-
dc.contributor.authorscopusid55986546100-
dc.contributor.authorscopusid7404444793-
dc.description.lastpage44en_US
dc.description.firstpage38en_US
dc.relation.volume82en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid4528747-
dc.contributor.daisngid7032973-
dc.contributor.daisngid465777-
dc.contributor.daisngid288819-
dc.contributor.daisngid2138004-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Li, XJ-
dc.contributor.wosstandardWOS:Song, CH-
dc.contributor.wosstandardWOS:Lopez, S-
dc.contributor.wosstandardWOS:Li, YS-
dc.contributor.wosstandardWOS:Lopez, JF-
dc.date.coverdateSeptiembre 2015en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr1,213
dc.description.jcr2,474
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-2360-6721-
crisitem.author.orcid0000-0002-6304-2801-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameLópez Suárez, Sebastián Miguel-
crisitem.author.fullNameLópez Feliciano, José Francisco-
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