Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/46925
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | González, Benito | en_US |
| dc.contributor.author | Pérez, José Antonio | en_US |
| dc.contributor.author | Khemchandani, Sunil L. | en_US |
| dc.contributor.author | Goñi-Iturri, Amaya | en_US |
| dc.contributor.author | Pino, Javier Del | en_US |
| dc.contributor.author | García, Javier | en_US |
| dc.contributor.other | Garcia Garcia, Javier | - |
| dc.contributor.other | del Pino, Javier | - |
| dc.date.accessioned | 2018-11-23T09:27:36Z | - |
| dc.date.available | 2018-11-23T09:27:36Z | - |
| dc.date.issued | 2005 | en_US |
| dc.identifier.isbn | 0-8194-5832-5 | en_US |
| dc.identifier.issn | 0277-786X | en_US |
| dc.identifier.uri | http://hdl.handle.net/10553/46925 | - |
| dc.description.abstract | In this paper models for the capacitance of cross integrated varactors based in the PN junction are presented. Three different approximations are assumed, in order to reproduce the measured results of the capacitance. The relative error with the measured capacitance is under 10% in all cases. | en_US |
| dc.language | eng | en_US |
| dc.relation.ispartof | Proceedings of SPIE - The International Society for Optical Engineering | en_US |
| dc.source | Proceedings of SPIE - The International Society for Optical Engineering[ISSN 0277-786X],v. 5837 PART II (116), p. 1015-1022 | en_US |
| dc.subject | 3307 Tecnología electrónica | en_US |
| dc.subject.other | Mos Varactors | en_US |
| dc.subject.other | Capacitance | en_US |
| dc.subject.other | Diffusions | en_US |
| dc.subject.other | Reverse modeling | en_US |
| dc.subject.other | Capacitors | en_US |
| dc.subject.other | Semiconductors | en_US |
| dc.title | DC modeling of PN integrated cross varactors | en_US |
| dc.type | info:eu-repo/semantics/conferenceObject | en_US |
| dc.type | ConferenceObject | en_US |
| dc.relation.conference | Conference on VLSI Circuits and Systems II | en_US |
| dc.identifier.doi | 10.1117/12.608279 | en_US |
| dc.identifier.scopus | 28344456220 | - |
| dc.identifier.isi | 000231723000104 | - |
| dcterms.isPartOf | VLSI Circuits and Systems II, Pts 1 and 2 | - |
| dcterms.source | VLSI Circuits and Systems II, Pts 1 and 2[ISSN 0277-786X],v. 5837, p. 1015-1022 | - |
| dc.contributor.authorscopusid | 56082155300 | - |
| dc.contributor.authorscopusid | 57199290756 | - |
| dc.contributor.authorscopusid | 9638804400 | - |
| dc.contributor.authorscopusid | 23004401100 | - |
| dc.contributor.authorscopusid | 57198296097 | - |
| dc.contributor.authorscopusid | 8383160900 | - |
| dc.description.lastpage | 1022 | en_US |
| dc.identifier.issue | 116 | - |
| dc.description.firstpage | 1015 | en_US |
| dc.relation.volume | 5837 PART II | en_US |
| dc.investigacion | Ingeniería y Arquitectura | en_US |
| dc.type2 | Actas de congresos | en_US |
| dc.identifier.wos | WOS:000231723000104 | - |
| dc.contributor.daisngid | 1092737 | - |
| dc.contributor.daisngid | 2015807 | - |
| dc.contributor.daisngid | 30061581 | - |
| dc.contributor.daisngid | 27076113 | - |
| dc.contributor.daisngid | 6299544 | - |
| dc.contributor.daisngid | 1188406 | - |
| dc.contributor.daisngid | 1774718 | - |
| dc.identifier.investigatorRID | I-8093-2015 | - |
| dc.identifier.investigatorRID | A-6677-2008 | - |
| dc.utils.revision | Sí | en_US |
| dc.contributor.wosstandard | WOS:Gonzalez, B | - |
| dc.contributor.wosstandard | WOS:Perez, JA | - |
| dc.contributor.wosstandard | WOS:Kemchandani, SL | - |
| dc.contributor.wosstandard | WOS:Goni-Iturri, A | - |
| dc.contributor.wosstandard | WOS:del Pino, J | - |
| dc.contributor.wosstandard | WOS:Garcia, J | - |
| dc.date.coverdate | Diciembre 2005 | en_US |
| dc.identifier.conferenceid | events120464 | - |
| dc.identifier.ulpgc | Sí | es |
| item.grantfulltext | open | - |
| item.fulltext | Con texto completo | - |
| crisitem.event.eventsstartdate | 09-05-2005 | - |
| crisitem.event.eventsenddate | 11-05-2005 | - |
| crisitem.author.dept | GIR IUMA: Tecnología Microelectrónica | - |
| crisitem.author.dept | IU de Microelectrónica Aplicada | - |
| crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
| crisitem.author.dept | GIR IUMA: Tecnología Microelectrónica | - |
| crisitem.author.dept | IU de Microelectrónica Aplicada | - |
| crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
| crisitem.author.dept | GIR IUMA: Tecnología Microelectrónica | - |
| crisitem.author.dept | IU de Microelectrónica Aplicada | - |
| crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
| crisitem.author.dept | GIR IUMA: Tecnología Microelectrónica | - |
| crisitem.author.dept | IU de Microelectrónica Aplicada | - |
| crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
| crisitem.author.orcid | 0000-0001-6864-9736 | - |
| crisitem.author.orcid | 0000-0003-0087-2370 | - |
| crisitem.author.orcid | 0000-0003-2610-883X | - |
| crisitem.author.orcid | 0000-0003-2610-883X | - |
| crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
| crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
| crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
| crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
| crisitem.author.fullName | González Pérez, Benito | - |
| crisitem.author.fullName | Khemchandani Lalchand, Sunil | - |
| crisitem.author.fullName | Del Pino Suárez, Francisco Javier | - |
| crisitem.author.fullName | Del Pino Suárez, Francisco Javier | - |
| Appears in Collections: | Actas de congresos | |
Adobe PDF (292,62 kB)
Page view(s)
66
checked on Jul 22, 2023
Download(s)
133
checked on Jul 22, 2023
Google ScholarTM
Check
Altmetric
Share
Export metadata
Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.