Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/46917
DC FieldValueLanguage
dc.contributor.authorGonzález, B.en_US
dc.contributor.authorIñiguez, B.en_US
dc.contributor.authorLazaro, A.en_US
dc.contributor.authorCerdeira, A.en_US
dc.date.accessioned2018-11-23T09:23:50Z-
dc.date.available2018-11-23T09:23:50Z-
dc.date.issued2011en_US
dc.identifier.isbn9781424478637en_US
dc.identifier.urihttp://hdl.handle.net/10553/46917-
dc.description.abstractDC numerical simulations of a Double-Gate (DG) MOSFET are performed including self-heating. Considering proper thermal conductivity, hydrodynamic model and optimizing pads, the resulting maximum lattice temperature of the transistor is 345 K, being located in channel layer, at the drain extension.en_US
dc.languageengen_US
dc.sourceProceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 (5744223)en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherThermal conductivityen_US
dc.subject.otherThermal resistanceen_US
dc.subject.otherMOSFET circuitsen_US
dc.subject.otherLogic gatesen_US
dc.subject.otherSiliconen_US
dc.subject.otherTemperature dependenceen_US
dc.subject.otherConductivityen_US
dc.titleDC thermal numerical simulation of DG MOSFETen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference8th Spanish Conference on Electron Devices, CDE 2011
dc.identifier.doi10.1109/SCED.2011.5744223
dc.identifier.scopus79955733047-
dc.contributor.authorscopusid56082155300-
dc.contributor.authorscopusid55148428400-
dc.contributor.authorscopusid56036357200-
dc.contributor.authorscopusid7003780995-
dc.identifier.issue5744223-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.date.coverdateMayo 2011
dc.identifier.conferenceidevents121402
dc.identifier.ulpgces
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate08-02-2011-
crisitem.event.eventsenddate11-02-2011-
crisitem.author.deptGIR IUMA: Tecnología Microelectrónica-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0001-6864-9736-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameGonzález Pérez, Benito-
Appears in Collections:Actas de congresos
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