|Title:||VESTA: A system level verification environment based on C++||Authors:||Shahdadpuri, Mahendra
Montiel-Nelson, Juan A.
|UNESCO Clasification:||3307 Tecnología electrónica||Keywords:||Simulators
|Issue Date:||2003||Journal:||Proceedings of SPIE - The International Society for Optical Engineering||Conference:||Conference on VLSI Circuits and Systems
VLSI Circuits and Systems
|Abstract:||System verification is an important issue to do at every design step to ensure the complete system correctness. The verification effort is becoming more time-consuming due to the increase in design complexity. New environments are necessary to reduce the complexity of this task and most importantly, reduce the time to develop it. Among the languages used in verification, C++ is powerful enough for encapsulating the necessary concepts in a set of classes and templates. This work introduces a framework that allows describing and verifying highly complex systems in a user-friendly and speedy way with C++ classes. These encapsulate hardware description and verification concepts and can be reused throughout a project and also in various development projects. Furthermore, the resulting libraries provide an easy-to-use interface for describing systems and writing test benches in C++, with a transparent connection to an HDL simulator. VESTA includes an advanced memory management with an extremely versatile linked list. The linked list access mode can change on-fly to a FIFO, a LIFO or a memory array access mode, among others. Experimental results demonstrate that the basic types provided by our verification environment excel the features of non-commercial solutions as Openvera or TestBuilder and commercial solutions such as 'e'3 language. Besides, the results achieved have shown significant productivity gain in creating reusable testbenches and in debugging simulation runs.||URI:||http://hdl.handle.net/10553/45064||ISBN:||0-8194-4977-6||ISSN:||0277-786X||DOI:||10.1117/12.498618||Source:||Proceedings of SPIE - The International Society for Optical Engineering[ISSN 0277-786X],v. 5117, p. 209-219|
|Appears in Collections:||Actas de congresos|
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