Identificador persistente para citar o vincular este elemento:
http://hdl.handle.net/10553/45064
Campo DC | Valor | idioma |
---|---|---|
dc.contributor.author | Shahdadpuri, Mahendra | en_US |
dc.contributor.author | Sosa, J. | en_US |
dc.contributor.author | Navarro, Héctor | en_US |
dc.contributor.author | Montiel-Nelson, Juan A. | en_US |
dc.contributor.author | Sarmiento, R. | en_US |
dc.contributor.other | Montiel-Nelson, Juan | - |
dc.contributor.other | Sarmiento, Roberto | - |
dc.date.accessioned | 2018-11-22T06:59:40Z | - |
dc.date.available | 2018-11-22T06:59:40Z | - |
dc.date.issued | 2003 | en_US |
dc.identifier.isbn | 0-8194-4977-6 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/45064 | - |
dc.description.abstract | System verification is an important issue to do at every design step to ensure the complete system correctness. The verification effort is becoming more time-consuming due to the increase in design complexity. New environments are necessary to reduce the complexity of this task and most importantly, reduce the time to develop it. Among the languages used in verification, C++ is powerful enough for encapsulating the necessary concepts in a set of classes and templates. This work introduces a framework that allows describing and verifying highly complex systems in a user-friendly and speedy way with C++ classes. These encapsulate hardware description and verification concepts and can be reused throughout a project and also in various development projects. Furthermore, the resulting libraries provide an easy-to-use interface for describing systems and writing test benches in C++, with a transparent connection to an HDL simulator. VESTA includes an advanced memory management with an extremely versatile linked list. The linked list access mode can change on-fly to a FIFO, a LIFO or a memory array access mode, among others. Experimental results demonstrate that the basic types provided by our verification environment excel the features of non-commercial solutions as Openvera or TestBuilder and commercial solutions such as 'e'3 language. Besides, the results achieved have shown significant productivity gain in creating reusable testbenches and in debugging simulation runs. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Proceedings of SPIE - The International Society for Optical Engineering | en_US |
dc.source | Proceedings of SPIE - The International Society for Optical Engineering[ISSN 0277-786X],v. 5117, p. 209-219 | en_US |
dc.subject | 3307 Tecnología electrónica | en_US |
dc.subject.other | Simulators | en_US |
dc.subject.other | Processing time | en_US |
dc.title | VESTA: A system level verification environment based on C++ | en_US |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dc.type | ConferenceObject | es |
dc.relation.conference | Conference on VLSI Circuits and Systems | |
dc.relation.conference | VLSI Circuits and Systems | |
dc.identifier.doi | 10.1117/12.498618 | |
dc.identifier.scopus | 0041327738 | - |
dc.identifier.isi | 000183950600021 | - |
dcterms.isPartOf | Vlsi Circuits And Systems | |
dcterms.source | Vlsi Circuits And Systems[ISSN 0277-786X],v. 5117, p. 209-219 | |
dc.contributor.authorscopusid | 6505513329 | - |
dc.contributor.authorscopusid | 7006310063 | - |
dc.contributor.authorscopusid | 23028289000 | - |
dc.contributor.authorscopusid | 6603626866 | - |
dc.contributor.authorscopusid | 35609452100 | - |
dc.description.lastpage | 219 | - |
dc.description.firstpage | 209 | - |
dc.relation.volume | 5117 | - |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Actas de congresos | en_US |
dc.identifier.wos | WOS:000183950600021 | - |
dc.contributor.daisngid | 12250291 | - |
dc.contributor.daisngid | 1739656 | |
dc.contributor.daisngid | 27213060 | - |
dc.contributor.daisngid | 34640290 | |
dc.contributor.daisngid | 1510114 | - |
dc.contributor.daisngid | 480589 | - |
dc.contributor.daisngid | 116294 | - |
dc.identifier.investigatorRID | K-6805-2013 | - |
dc.identifier.investigatorRID | No ID | - |
dc.utils.revision | Sí | en_US |
dc.contributor.wosstandard | WOS:Shahdadpuri, M | |
dc.contributor.wosstandard | WOS:Sosa, J | |
dc.contributor.wosstandard | WOS:Navarro, H | |
dc.contributor.wosstandard | WOS:Montiel-Nelson, JA | |
dc.contributor.wosstandard | WOS:Sarmiento, R | |
dc.date.coverdate | Septiembre 2003 | |
dc.identifier.conferenceid | events120355 | |
dc.identifier.ulpgc | Sí | es |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.event.eventsstartdate | 19-05-2003 | - |
crisitem.event.eventsstartdate | 19-05-2003 | - |
crisitem.event.eventsenddate | 21-05-2003 | - |
crisitem.event.eventsenddate | 21-05-2003 | - |
crisitem.author.dept | GIR IUMA: Instrumentación avanzada | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Instrumentación avanzada | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0003-1838-3073 | - |
crisitem.author.orcid | 0000-0003-4323-8097 | - |
crisitem.author.orcid | 0000-0002-4843-0507 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Sosa González, Carlos Javier | - |
crisitem.author.fullName | Montiel Nelson, Juan Antonio | - |
crisitem.author.fullName | Sarmiento Rodríguez, Roberto | - |
Colección: | Actas de congresos |
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