Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/45060
Título: System-level verification methodology for advanced switch fabrics
Autores/as: Sosa, J. 
Montiel-Nelson, Juan A. 
Navarro, Héctor
Shahdadpuri, Mahendra
Sarmiento, R. 
Clasificación UNESCO: 3307 Tecnología electrónica
Palabras clave: Verification
Model checking
Theorem prover
Fecha de publicación: 2003
Publicación seriada: Proceedings of SPIE - The International Society for Optical Engineering 
Conferencia: Conference on VLSI Circuits and Systems 
VLSI Circuits and Systems 
Resumen: A system-level verification methodology for advanced switch fabrics is introduced in this paper. Due to the short life cycles and the changing standards, the design and verification of new products require new design and verification tools. As result of our methodology, a verification framework is also presented. The decomposition of each interface of the switch fabric allows the reconfiguration of the framework, when a new revision of the design is defined. This idea promotes the reuse of the main interface code and verification statements. The development of the verification framework in C++, 'e'1 and Verilog demonstrates that our methodology can be applied independently of the programming language. New features, added to the framework, such as error insertion, enhance the verification coverage for corner cases. On the other hand, the golden reference layer is the key of the automatic verification, because a high level model can be used as reference model to check the correctness of the design automatically. Several commercial and non-commercial advanced switch fabrics have been verified using this method. The usefulness of the proposed methodology is demonstrated by GigaStream Chip Set2 functional success and the saving of a 60% in the verification time per effort unit.
URI: http://hdl.handle.net/10553/45060
ISBN: 0-8194-4977-6
ISSN: 0277-786X
DOI: 10.1117/12.498612
Fuente: Proceedings of SPIE - The International Society for Optical Engineering[ISSN 0277-786X],v. 5117, p. 187-198
Colección:Actas de congresos
Vista completa

Visitas

73
actualizado el 23-ene-2024

Google ScholarTM

Verifica

Altmetric


Comparte



Exporta metadatos



Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.