Identificador persistente para citar o vincular este elemento:
http://hdl.handle.net/10553/45060
Campo DC | Valor | idioma |
---|---|---|
dc.contributor.author | Sosa, J. | en_US |
dc.contributor.author | Montiel-Nelson, Juan A. | en_US |
dc.contributor.author | Navarro, Héctor | en_US |
dc.contributor.author | Shahdadpuri, Mahendra | en_US |
dc.contributor.author | Sarmiento, R. | en_US |
dc.contributor.other | Sosa, Javier | - |
dc.contributor.other | Montiel-Nelson, Juan | - |
dc.contributor.other | Sarmiento, Roberto | - |
dc.date.accessioned | 2018-11-22T06:57:55Z | - |
dc.date.available | 2018-11-22T06:57:55Z | - |
dc.date.issued | 2003 | en_US |
dc.identifier.isbn | 0-8194-4977-6 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/45060 | - |
dc.description.abstract | A system-level verification methodology for advanced switch fabrics is introduced in this paper. Due to the short life cycles and the changing standards, the design and verification of new products require new design and verification tools. As result of our methodology, a verification framework is also presented. The decomposition of each interface of the switch fabric allows the reconfiguration of the framework, when a new revision of the design is defined. This idea promotes the reuse of the main interface code and verification statements. The development of the verification framework in C++, 'e'1 and Verilog demonstrates that our methodology can be applied independently of the programming language. New features, added to the framework, such as error insertion, enhance the verification coverage for corner cases. On the other hand, the golden reference layer is the key of the automatic verification, because a high level model can be used as reference model to check the correctness of the design automatically. Several commercial and non-commercial advanced switch fabrics have been verified using this method. The usefulness of the proposed methodology is demonstrated by GigaStream Chip Set2 functional success and the saving of a 60% in the verification time per effort unit. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Proceedings of SPIE - The International Society for Optical Engineering | en_US |
dc.source | Proceedings of SPIE - The International Society for Optical Engineering[ISSN 0277-786X],v. 5117, p. 187-198 | en_US |
dc.subject | 3307 Tecnología electrónica | en_US |
dc.subject.other | Verification | en_US |
dc.subject.other | Model checking | en_US |
dc.subject.other | Theorem prover | en_US |
dc.title | System-level verification methodology for advanced switch fabrics | en_US |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dc.type | ConferenceObject | es |
dc.relation.conference | Conference on VLSI Circuits and Systems | |
dc.relation.conference | VLSI Circuits and Systems | |
dc.identifier.doi | 10.1117/12.498612 | |
dc.identifier.scopus | 0041327753 | - |
dc.identifier.isi | 000183950600019 | - |
dcterms.isPartOf | Vlsi Circuits And Systems | |
dcterms.source | Vlsi Circuits And Systems[ISSN 0277-786X],v. 5117, p. 187-198 | |
dc.contributor.authorscopusid | 56231679300 | - |
dc.contributor.authorscopusid | 6603626866 | - |
dc.contributor.authorscopusid | 23028289000 | - |
dc.contributor.authorscopusid | 6505513329 | - |
dc.contributor.authorscopusid | 35609452100 | - |
dc.description.lastpage | 198 | - |
dc.description.firstpage | 187 | - |
dc.relation.volume | 5117 | - |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Actas de congresos | en_US |
dc.identifier.wos | WOS:000183950600019 | - |
dc.contributor.daisngid | 1739656 | - |
dc.contributor.daisngid | 480589 | - |
dc.contributor.daisngid | 34640290 | |
dc.contributor.daisngid | 1510114 | - |
dc.contributor.daisngid | 12250291 | - |
dc.contributor.daisngid | 116294 | - |
dc.identifier.investigatorRID | L-8617-2014 | - |
dc.identifier.investigatorRID | K-6805-2013 | - |
dc.identifier.investigatorRID | No ID | - |
dc.utils.revision | Sí | en_US |
dc.contributor.wosstandard | WOS:Sosa, J | |
dc.contributor.wosstandard | WOS:Montiel-Nelson, JA | |
dc.contributor.wosstandard | WOS:Navarro, H | |
dc.contributor.wosstandard | WOS:Shahdadpuri, M | |
dc.contributor.wosstandard | WOS:Sarmiento, R | |
dc.date.coverdate | Septiembre 2003 | |
dc.identifier.conferenceid | events120355 | |
dc.identifier.ulpgc | Sí | es |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.event.eventsstartdate | 19-05-2003 | - |
crisitem.event.eventsstartdate | 19-05-2003 | - |
crisitem.event.eventsenddate | 21-05-2003 | - |
crisitem.event.eventsenddate | 21-05-2003 | - |
crisitem.author.dept | GIR IUMA: Instrumentación avanzada | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Instrumentación avanzada | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0003-1838-3073 | - |
crisitem.author.orcid | 0000-0003-4323-8097 | - |
crisitem.author.orcid | 0000-0002-4843-0507 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Sosa González, Carlos Javier | - |
crisitem.author.fullName | Montiel Nelson, Juan Antonio | - |
crisitem.author.fullName | Sarmiento Rodríguez, Roberto | - |
Colección: | Actas de congresos |
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