Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/42738
| Title: | Surface inspection by monitoring spectral shifts of localized plasmon resonances | Authors: | Albella, P. Moreno, F. Saiz, J. M. González, F. |
Issue Date: | 2008 | Journal: | Optics Express | URI: | http://hdl.handle.net/10553/42738 | DOI: | 10.1364/OE.16.012872 | Source: | Optics Express,v. 16, p. 12872-12879 |
| Appears in Collections: | Artículos |
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