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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/42738
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dc.contributor.authorAlbella, P.
dc.contributor.authorMoreno, F.
dc.contributor.authorSaiz, J. M.
dc.contributor.authorGonzález, F.
dc.date.accessioned2018-11-21T10:53:56Z-
dc.date.available2018-11-21T10:53:56Z-
dc.date.issued2008
dc.identifier.urihttp://hdl.handle.net/10553/42738-
dc.relation.ispartofOptics Express
dc.sourceOptics Express,v. 16, p. 12872-12879
dc.titleSurface inspection by monitoring spectral shifts of localized plasmon resonances
dc.typeinfo:eu-repo/semantics/articlees
dc.typeArticlees
dc.identifier.doi10.1364/OE.16.012872
dc.identifier.scopus50049109732-
dc.contributor.authorscopusid14032984700
dc.contributor.authorscopusid56251147800
dc.contributor.authorscopusid7005152258
dc.contributor.authorscopusid56034341000
dc.description.lastpage12879
dc.description.firstpage12872
dc.relation.volume16
dc.type2Artículoes
dc.identifier.ulpgcSíes
dc.description.jcr3,88
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.orcid0000-0001-7531-7828-
crisitem.author.fullNameAlbella Echave, Pablo-
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