Please use this identifier to cite or link to this item: https://accedacris.ulpgc.es/handle/10553/143355
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dc.contributor.authorPadrón Medina, Miguel Ángelen_US
dc.contributor.authorTrujillo Pino, Agustín Rafaelen_US
dc.contributor.authorSuárez, Jose Pabloen_US
dc.date.accessioned2025-07-24T14:03:04Z-
dc.date.available2025-07-24T14:03:04Z-
dc.date.issued2025en_US
dc.identifier.issn0378-4754en_US
dc.identifier.otherScopus-
dc.identifier.urihttps://accedacris.ulpgc.es/handle/10553/143355-
dc.description.abstractWe study the similarity classes appearing in the iterative Longest Edge Bisection (LEB), of an improved family of nearly equilateral tetrahedra. We focus here on the R1+ family as a generalization of the family mentioned by Adler in Adler (1983). We characterize the finite convergence of similarity classes using the Similarity Classes Longest Edge Bisection (SCLEB) algorithm. We prove that below the bound of 37 similarity classes, a number n≤37 classes are generated where n∈{4,8,9,13,21,37}. Using a tetrahedra sextuple representation and SCLEB, all the generated classes are clearly delimited, thereby improving the results by Adler and others.en_US
dc.languageengen_US
dc.relation.ispartofMathematics and Computers in Simulationen_US
dc.sourceMathematics and Computers in Simulation [ISSN 0378-4754],v. 238, p. 555-567, (Julio 2025)en_US
dc.subject330506 Ingeniería civilen_US
dc.subject.otherLongest Edge Bisectionen_US
dc.subject.otherNear Equilateralen_US
dc.subject.otherSimilarity Classesen_US
dc.subject.otherTetrahedraen_US
dc.titleConvergence of the R1+ tetrahedra family in iterative Longest Edge Bisectionen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.matcom.2025.06.023en_US
dc.identifier.scopus105010152006-
dc.contributor.orcid0000-0001-5493-3090-
dc.contributor.orcid0000-0001-6212-5317-
dc.contributor.orcid0000-0001-8140-9008-
dc.contributor.authorscopusid6603825227-
dc.contributor.authorscopusid58083732600-
dc.contributor.authorscopusid7202040282-
dc.description.lastpage567en_US
dc.description.firstpage555en_US
dc.relation.volume238en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionen_US
dc.date.coverdateJulio 2025en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-INGen_US
dc.description.sjr0,969
dc.description.jcr4,4
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
dc.description.miaricds11,0
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Informática y Sistemas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.orcid0000-0001-6212-5317-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
crisitem.author.fullNameTrujillo Pino, Agustín Rafael-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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