Please use this identifier to cite or link to this item: https://accedacris.ulpgc.es/handle/10553/142180
Title: Roadmap for the Characterization and Validation of Hyperspectral Microscopic Systems
Authors: Quintana Quintana, Laura 
Rosa Olmeda, Gonzalo
Santana Núñez, Javier 
Chavarrias, Miguel
Ortega, Samuel 
Sancho, Jaime
Fabelo, Himar 
Juarez, Eduardo
Callicó, Gustavo M. 
UNESCO Clasification: 33 Ciencias tecnológicas
Keywords: Spatial-Frequency Response
Calibration
Oecf
Microscopy
Cameras, et al
Issue Date: 2025
Journal: IEEE Transactions on Instrumentation and Measurement 
Abstract: Hyperspectral imaging (HSI) is a powerful image technique that allows capturing spatial and spectral information, being able to characterize materials, tissues, and elements in a noninvasive manner. HSI technology is well established at the macroscopic level, but there are still technical challenges to overcome before it can be applied to the microscopic world, such as the lack of standardized characterization methodologies to HS microscopic systems that allow the correct data acquisition as well as ensure the repeatability of the experiments. In this work, we propose a comprehensive roadmap for characterizing and validating such systems, integrating essential parameters highlighted in the current state of the art. Furthermore, we provide a list of the materials needed for their characterization and testing of the methodology on two different HS microscopic systems chosen as representative of common configurations in the field, where an HS camera is integrated into a bright-field microscope. Our proposed roadmap assesses the following parameters: dynamic range (DR), noise quantification, pixel size, spatial frequency response (SFR), spatial scanning accuracy, spatial repeatability, flat-field correction, tone transfer, and spectral sensitivity. We address the challenge of unifying these parameters into a unified and standardized roadmap. All data used to characterize both systems have been captured by the authors. In summary, this comprehensive analysis provides a guideline for the scientific community to develop and characterize HS microscopic systems to ensure reliability, efficiency, and accuracy.
URI: https://accedacris.ulpgc.es/handle/10553/142180
ISSN: 0018-9456
DOI: 10.1109/TIM.2025.3575989
Source: IEEE Transactions On Instrumentation And Measurement[ISSN 0018-9456],v. 74, (2025)
Appears in Collections:Artículos
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