Identificador persistente para citar o vincular este elemento: https://accedacris.ulpgc.es/handle/10553/142180
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dc.contributor.authorQuintana Quintana, Lauraen_US
dc.contributor.authorRosa Olmeda, Gonzaloen_US
dc.contributor.authorSantana Núñez, Javieren_US
dc.contributor.authorChavarrias, Miguelen_US
dc.contributor.authorOrtega, Samuelen_US
dc.contributor.authorSancho, Jaimeen_US
dc.contributor.authorFabelo, Himaren_US
dc.contributor.authorJuarez, Eduardoen_US
dc.contributor.authorCallicó, Gustavo M.en_US
dc.date.accessioned2025-07-07T08:33:25Z-
dc.date.available2025-07-07T08:33:25Z-
dc.date.issued2025en_US
dc.identifier.issn0018-9456en_US
dc.identifier.otherWoS-
dc.identifier.urihttps://accedacris.ulpgc.es/handle/10553/142180-
dc.description.abstractHyperspectral imaging (HSI) is a powerful image technique that allows capturing spatial and spectral information, being able to characterize materials, tissues, and elements in a noninvasive manner. HSI technology is well established at the macroscopic level, but there are still technical challenges to overcome before it can be applied to the microscopic world, such as the lack of standardized characterization methodologies to HS microscopic systems that allow the correct data acquisition as well as ensure the repeatability of the experiments. In this work, we propose a comprehensive roadmap for characterizing and validating such systems, integrating essential parameters highlighted in the current state of the art. Furthermore, we provide a list of the materials needed for their characterization and testing of the methodology on two different HS microscopic systems chosen as representative of common configurations in the field, where an HS camera is integrated into a bright-field microscope. Our proposed roadmap assesses the following parameters: dynamic range (DR), noise quantification, pixel size, spatial frequency response (SFR), spatial scanning accuracy, spatial repeatability, flat-field correction, tone transfer, and spectral sensitivity. We address the challenge of unifying these parameters into a unified and standardized roadmap. All data used to characterize both systems have been captured by the authors. In summary, this comprehensive analysis provides a guideline for the scientific community to develop and characterize HS microscopic systems to ensure reliability, efficiency, and accuracy.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Instrumentation and Measurementen_US
dc.sourceIEEE Transactions On Instrumentation And Measurement[ISSN 0018-9456],v. 74, (2025)en_US
dc.subject33 Ciencias tecnológicasen_US
dc.subject.otherSpatial-Frequency Responseen_US
dc.subject.otherCalibrationen_US
dc.subject.otherOecfen_US
dc.subject.otherMicroscopyen_US
dc.subject.otherCamerasen_US
dc.subject.otherSpatial Resolutionen_US
dc.subject.otherHyperspectral Imagingen_US
dc.subject.otherAccuracyen_US
dc.subject.otherEuropeen_US
dc.subject.otherSignal To Noise Ratioen_US
dc.subject.otherStandardsen_US
dc.subject.otherDynamic Rangeen_US
dc.subject.otherThree-Dimensional Printingen_US
dc.subject.otherHyperspectral (Hs) Imaging (Hsi)en_US
dc.subject.otherInstrumentationen_US
dc.subject.otherMicroscopyen_US
dc.subject.otherSystem Characterizationen_US
dc.titleRoadmap for the Characterization and Validation of Hyperspectral Microscopic Systemsen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TIM.2025.3575989en_US
dc.identifier.isi001515653400002-
dc.identifier.eissn1557-9662-
dc.relation.volume74en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid3187737-
dc.contributor.daisngid76083746-
dc.contributor.daisngid62250254-
dc.contributor.daisngid77610011-
dc.contributor.daisngid1186813-
dc.contributor.daisngid77788265-
dc.contributor.daisngid647614-
dc.contributor.daisngid77640612-
dc.contributor.daisngid1339508-
dc.description.numberofpages13en_US
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Quintana-Quintana, L-
dc.contributor.wosstandardWOS:Olmeda, GR-
dc.contributor.wosstandardWOS:Santana-Nunez, J-
dc.contributor.wosstandardWOS:Chavarrías, M-
dc.contributor.wosstandardWOS:Ortega, S-
dc.contributor.wosstandardWOS:Sancho, J-
dc.contributor.wosstandardWOS:Fabelo, H-
dc.contributor.wosstandardWOS:Juárez, E-
dc.contributor.wosstandardWOS:Callico, GM-
dc.date.coverdate2025en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr1,536
dc.description.jcr5,6
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
dc.description.miaricds11,0
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-1154-6490-
crisitem.author.orcid0009-0000-5029-5239-
crisitem.author.orcid0000-0002-7519-954X-
crisitem.author.orcid0000-0002-9794-490X-
crisitem.author.orcid0000-0002-3784-5504-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameQuintana Quintana, Laura-
crisitem.author.fullNameSantana Núñez, Javier-
crisitem.author.fullNameOrtega Sarmiento, Samuel-
crisitem.author.fullNameFabelo Gómez, Himar Antonio-
crisitem.author.fullNameMarrero Callicó, Gustavo Iván-
Colección:Artículos
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