Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/121783
Campo DC Valoridioma
dc.contributor.authorSánchez Clemente, Antonio Joséen_US
dc.contributor.authorEntrena, L.en_US
dc.contributor.authorGarcia-Valderas, M.en_US
dc.date.accessioned2023-04-10T17:33:48Z-
dc.date.available2023-04-10T17:33:48Z-
dc.date.issued2014en_US
dc.identifier.isbn9781479953233en_US
dc.identifier.urihttp://hdl.handle.net/10553/121783-
dc.description.abstractApproximate logic circuits can be used in hardware redundancy approaches to reduce the overheads at the expense of slightly sacrificing robustness. However, a major drawback of existing logic approximation methods lies in the difficulty of estimating the effect of approximations in the total error probability and therefore to identify and select optimal approximation transformations. In this work, we propose an approach to build approximate logic circuits for a given acceptable error target. Using signal probabilities, we can dynamically estimate the probability of error that can be expected when an approximation is taken, use it to iteratively select optimal transformations and keep an estimation of the total error probability in order to stick to a given target. Experimental results show how this approach can be used to generate optimal approximate logic circuits for any particular tradeoff between robustness and area overhead.en_US
dc.languageengen_US
dc.relation.ispartofProceedings of the 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014en_US
dc.subject330790 Microelectrónicaen_US
dc.subject.otherApproximate circuiten_US
dc.subject.otherError detection and correctionen_US
dc.subject.othersignal probabilityen_US
dc.subject.otherSoft erroren_US
dc.subject.othertestabilityen_US
dc.titleError masking with approximate logic circuits using dynamic probability estimationsen_US
dc.typeinfo:eu-repo/semantics/conferenceobjecten_US
dc.typeConference proceedingsen_US
dc.relation.conferenceIEEE 20th International On-Line Testing Symposium, IOLTS 2014en_US
dc.identifier.doi10.1109/IOLTS.2014.6873685en_US
dc.identifier.scopus2-s2.0-84906667893-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.identifier.ulpgcNoen_US
dc.contributor.buulpgcBU-TELen_US
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.orcid0000-0002-2142-7885-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSánchez Clemente, Antonio José-
Colección:Actas de congresos
Vista resumida

Citas SCOPUSTM   

12
actualizado el 17-nov-2024

Google ScholarTM

Verifica

Altmetric


Comparte



Exporta metadatos



Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.