Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/121783
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sánchez Clemente, Antonio José | en_US |
dc.contributor.author | Entrena, L. | en_US |
dc.contributor.author | Garcia-Valderas, M. | en_US |
dc.date.accessioned | 2023-04-10T17:33:48Z | - |
dc.date.available | 2023-04-10T17:33:48Z | - |
dc.date.issued | 2014 | en_US |
dc.identifier.isbn | 9781479953233 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/121783 | - |
dc.description.abstract | Approximate logic circuits can be used in hardware redundancy approaches to reduce the overheads at the expense of slightly sacrificing robustness. However, a major drawback of existing logic approximation methods lies in the difficulty of estimating the effect of approximations in the total error probability and therefore to identify and select optimal approximation transformations. In this work, we propose an approach to build approximate logic circuits for a given acceptable error target. Using signal probabilities, we can dynamically estimate the probability of error that can be expected when an approximation is taken, use it to iteratively select optimal transformations and keep an estimation of the total error probability in order to stick to a given target. Experimental results show how this approach can be used to generate optimal approximate logic circuits for any particular tradeoff between robustness and area overhead. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014 | en_US |
dc.subject | 330790 Microelectrónica | en_US |
dc.subject.other | Approximate circuit | en_US |
dc.subject.other | Error detection and correction | en_US |
dc.subject.other | signal probability | en_US |
dc.subject.other | Soft error | en_US |
dc.subject.other | testability | en_US |
dc.title | Error masking with approximate logic circuits using dynamic probability estimations | en_US |
dc.type | info:eu-repo/semantics/conferenceobject | en_US |
dc.type | Conference proceedings | en_US |
dc.relation.conference | IEEE 20th International On-Line Testing Symposium, IOLTS 2014 | en_US |
dc.identifier.doi | 10.1109/IOLTS.2014.6873685 | en_US |
dc.identifier.scopus | 2-s2.0-84906667893 | - |
dc.contributor.orcid | #NODATA# | - |
dc.contributor.orcid | #NODATA# | - |
dc.contributor.orcid | #NODATA# | - |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Actas de congresos | en_US |
dc.utils.revision | Sí | en_US |
dc.identifier.ulpgc | No | en_US |
dc.contributor.buulpgc | BU-TEL | en_US |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.orcid | 0000-0002-2142-7885 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Sánchez Clemente, Antonio José | - |
Appears in Collections: | Actas de congresos |
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