Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/121433
Campo DC Valoridioma
dc.contributor.authorCruz-Guerrero, Inés A.en_US
dc.contributor.authorLeón Martín, Sonia Raquelen_US
dc.contributor.authorGranados-Castro, Lilianaen_US
dc.contributor.authorFabelo Gómez, Himar Antonioen_US
dc.contributor.authorOrtega Sarmiento,Samuelen_US
dc.contributor.authorCampos-Delgado, Daniel Ulisesen_US
dc.contributor.authorMarrero Callicó, Gustavo Ivánen_US
dc.date.accessioned2023-03-21T12:17:23Z-
dc.date.available2023-03-21T12:17:23Z-
dc.date.issued2022en_US
dc.identifier.isbn9781665474047en_US
dc.identifier.urihttp://hdl.handle.net/10553/121433-
dc.description.abstractToday, hyperspectral (HS) imaging has become a powerful tool to identify remotely the composition of an interest area through the joint acquisition of spatial and spectral information. However, like in most imaging techniques, unwanted effects may occur during data acquisition, such as noise, changes in light intensity, temperature differences, or optical variations. In HS imaging, these problems can be attenuated using a reflectance calibration stage and optical filtering. Nevertheless, optical filtering might induce some distortion that could complicate the posterior image processing stage. In this work, we present a new proposal for reflectance calibration that compensates for optical alterations during the acquisition of an HS image. The proposed methodology was evaluated on an HS image of synthetic squares of various materials with specific spectral responses. The results of our proposal show high performance in two classification tests using the K-means algorithm with 97% and 88% accuracy; in comparison with the standard reflectance calibration from the literature that obtained 77% and 64% accuracy. These results illustrate the performance gain of the proposed formulation, which besides maintaining the characteristic features of the compounds within the HS image, keeps the resulting reflectance into fixed lower and upper bounds, which avoids a post-calibration normalization step.en_US
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceProceedings - 2022 25th Euromicro Conference on Digital System Design, DSD 2022 / Himar Fabelo, Samuel Ortega, Amund Skavhaug (Eds.), p. 855-862en_US
dc.subjectInvestigaciónen_US
dc.subject.otherHyperspectral imagingen_US
dc.subject.otherOptical filtersen_US
dc.subject.otherRe-flectance calibrationen_US
dc.titleReflectance Calibration with Normalization Correction in Hyperspectral Imagingen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference25th Euromicro Conference on Digital System Design (DSD 2022)en_US
dc.identifier.doi10.1109/DSD57027.2022.00120en_US
dc.identifier.scopus2-s2.0-85142749172-
dc.contributor.orcid0000-0001-8034-8530-
dc.contributor.orcid0000-0002-4287-3200-
dc.contributor.orcid0000-0002-6301-9062-
dc.contributor.orcid0000-0002-9794-490X-
dc.contributor.orcid0000-0002-7519-954X-
dc.contributor.orcid0000-0002-1555-0131-
dc.contributor.orcid0000-0002-3784-5504-
dc.description.lastpage862en_US
dc.description.firstpage855en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.description.numberofpages8en_US
dc.utils.revisionen_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-4287-3200-
crisitem.author.orcid0000-0002-9794-490X-
crisitem.author.orcid0000-0002-7519-954X-
crisitem.author.orcid0000-0002-3784-5504-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameLeón Martín, Sonia Raquel-
crisitem.author.fullNameFabelo Gómez, Himar Antonio-
crisitem.author.fullNameOrtega Sarmiento,Samuel-
crisitem.author.fullNameMarrero Callicó, Gustavo Iván-
crisitem.event.eventsstartdate31-08-2022-
crisitem.event.eventsenddate02-09-2022-
Colección:Actas de congresos
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