Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/121433
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cruz-Guerrero, Inés A. | en_US |
dc.contributor.author | León Martín, Sonia Raquel | en_US |
dc.contributor.author | Granados-Castro, Liliana | en_US |
dc.contributor.author | Fabelo Gómez, Himar Antonio | en_US |
dc.contributor.author | Ortega Sarmiento,Samuel | en_US |
dc.contributor.author | Campos-Delgado, Daniel Ulises | en_US |
dc.contributor.author | Marrero Callicó, Gustavo Iván | en_US |
dc.date.accessioned | 2023-03-21T12:17:23Z | - |
dc.date.available | 2023-03-21T12:17:23Z | - |
dc.date.issued | 2022 | en_US |
dc.identifier.isbn | 9781665474047 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/121433 | - |
dc.description.abstract | Today, hyperspectral (HS) imaging has become a powerful tool to identify remotely the composition of an interest area through the joint acquisition of spatial and spectral information. However, like in most imaging techniques, unwanted effects may occur during data acquisition, such as noise, changes in light intensity, temperature differences, or optical variations. In HS imaging, these problems can be attenuated using a reflectance calibration stage and optical filtering. Nevertheless, optical filtering might induce some distortion that could complicate the posterior image processing stage. In this work, we present a new proposal for reflectance calibration that compensates for optical alterations during the acquisition of an HS image. The proposed methodology was evaluated on an HS image of synthetic squares of various materials with specific spectral responses. The results of our proposal show high performance in two classification tests using the K-means algorithm with 97% and 88% accuracy; in comparison with the standard reflectance calibration from the literature that obtained 77% and 64% accuracy. These results illustrate the performance gain of the proposed formulation, which besides maintaining the characteristic features of the compounds within the HS image, keeps the resulting reflectance into fixed lower and upper bounds, which avoids a post-calibration normalization step. | en_US |
dc.language | eng | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
dc.source | Proceedings - 2022 25th Euromicro Conference on Digital System Design, DSD 2022 / Himar Fabelo, Samuel Ortega, Amund Skavhaug (Eds.), p. 855-862 | en_US |
dc.subject | Investigación | en_US |
dc.subject.other | Hyperspectral imaging | en_US |
dc.subject.other | Optical filters | en_US |
dc.subject.other | Re-flectance calibration | en_US |
dc.title | Reflectance Calibration with Normalization Correction in Hyperspectral Imaging | en_US |
dc.type | info:eu-repo/semantics/conferenceObject | en_US |
dc.type | ConferenceObject | en_US |
dc.relation.conference | 25th Euromicro Conference on Digital System Design (DSD 2022) | en_US |
dc.identifier.doi | 10.1109/DSD57027.2022.00120 | en_US |
dc.identifier.scopus | 2-s2.0-85142749172 | - |
dc.contributor.orcid | 0000-0001-8034-8530 | - |
dc.contributor.orcid | 0000-0002-4287-3200 | - |
dc.contributor.orcid | 0000-0002-6301-9062 | - |
dc.contributor.orcid | 0000-0002-9794-490X | - |
dc.contributor.orcid | 0000-0002-7519-954X | - |
dc.contributor.orcid | 0000-0002-1555-0131 | - |
dc.contributor.orcid | 0000-0002-3784-5504 | - |
dc.description.lastpage | 862 | en_US |
dc.description.firstpage | 855 | en_US |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Actas de congresos | en_US |
dc.description.numberofpages | 8 | en_US |
dc.utils.revision | Sí | en_US |
dc.identifier.ulpgc | Sí | en_US |
dc.contributor.buulpgc | BU-TEL | en_US |
item.grantfulltext | open | - |
item.fulltext | Con texto completo | - |
crisitem.event.eventsstartdate | 31-08-2022 | - |
crisitem.event.eventsenddate | 02-09-2022 | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0002-4287-3200 | - |
crisitem.author.orcid | 0000-0002-9794-490X | - |
crisitem.author.orcid | 0000-0002-7519-954X | - |
crisitem.author.orcid | 0000-0002-3784-5504 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | León Martín,Sonia Raquel | - |
crisitem.author.fullName | Fabelo Gómez, Himar Antonio | - |
crisitem.author.fullName | Ortega Sarmiento,Samuel | - |
crisitem.author.fullName | Marrero Callicó, Gustavo Iván | - |
Appears in Collections: | Actas de congresos |
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