Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/133372
Título: Analysis of Despeckling Filters Using Ratio Images and Divergence Measurement
Autores/as: Gomez, Luis 
Cardona Mesa, Ahmed Alejandro 
Vasquez Salazar, Ruben Dario 
Travieso-González, Carlos M. 
Clasificación UNESCO: 33 Ciencias tecnológicas
Palabras clave: Speckle Reduction
Sar Images
Enhancement
Synthetic Aperture Radar (Sar)
Speckle, et al.
Fecha de publicación: 2024
Publicación seriada: Remote Sensing 
Resumen: This paper presents an analysis of different despeckling filters applied on both synthetically corrupted optical images and actual Synthetic Aperture Radar (SAR) images. Several authors use optical images as ground truth and then the images are corrupted by using a Gamma model to simulate the speckle, while other approaches use methods like multitemporal fusion to generate a ground truth using actual SAR images, which provides a result somehow equivalent to the one from the common multi look technique. Well-known filters, like local, and non-local and some of them based on artificial intelligence and deep learning, are applied to these two types of images and their performance is assessed by a quantitative analysis. One last validation is performed with a newly proposed method by using ratio images, resulting from the mathematical division (Hadamard division) of filtered and noisy images, to measure how similar the initial and the remaining speckle are by considering its Gamma distribution and divergence measurement. Our findings suggest that despeckling models relying on artificial intelligence exhibit notable efficiency, albeit concurrently displaying inflexibility when applied to particular image types based on the training dataset. Additionally, our experiments underscore the utility of the divergence measurement in ratio images in facilitating both visual inspection and quantitative evaluation of residual speckles within the filtered images.
URI: http://hdl.handle.net/10553/133372
ISSN: 2072-4292
DOI: 10.3390/rs16162893
Fuente: Remote Sensing [eISSN 2072-4292], v. 16, n. 16, 2893, (Agosto 2024)
Colección:Artículos
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