1. accedaCRIS
  2. Publicaciones
  3. Actas de congresos
Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/76993
DC FieldValueLanguage
dc.contributor.authorCordo Chinea, M.en_US
dc.contributor.authorSendra Sendra, José Ramónen_US
dc.contributor.authorLópez Silva, S. M.en_US
dc.contributor.authorViera Ramírez, Agustínen_US
dc.date.accessioned2020-12-27T10:08:37Z-
dc.date.available2020-12-27T10:08:37Z-
dc.date.issued2003en_US
dc.identifier.isbn0-8194-5011-1en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/76993-
dc.description.abstractPigmented skin lesions have been studied by optical diffuse reflectance spectroscopy. Our measure system consists of a portable visible near infrared (550-1000 nm) spectrometer, tungsten-halogen lamp and fibre optic probes. The system was tested in steady state conditions. After that, a reproducibility study of normal and pigmented skin spectra was carried out. A small scale study has been conducted in human volunteers with different clinically evaluated lesions. The analysis of the collected spectra is shown.en_US
dc.languageengen_US
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.sourceProceedings of SPIE - The International Society for Optical Engineering [ISSN 0277-786X], v. 5141, p. 157-167, (2003)en_US
dc.subject3314 Tecnología médicaen_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherMelanomaen_US
dc.subject.otherOptical Spectroscopyen_US
dc.subject.otherReflectance Spectroscopyen_US
dc.subject.otherSkin Pigmented Lesionsen_US
dc.subject.otherFibre Opticsen_US
dc.titlePigmented skin lesions studied by VIS-NIR diffuse reflectance spectroscopyen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conferenceConference on Diagnostic Optical Spectroscopy in Biomedicine IIen_US
dc.identifier.scopus1342289246-
dc.identifier.isi000186471600020-
dc.contributor.authorscopusid55663944000-
dc.contributor.authorscopusid6507060909-
dc.contributor.authorscopusid6603011574-
dc.contributor.authorscopusid6506976673-
dc.description.lastpage167en_US
dc.description.firstpage157en_US
dc.relation.volume5141en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.contributor.daisngid5871848-
dc.contributor.daisngid1648999-
dc.contributor.daisngid3913733-
dc.contributor.daisngid3538853-
dc.description.numberofpages11en_US
dc.utils.revisionSíen_US
dc.contributor.wosstandardWOS:Chinea, MC-
dc.contributor.wosstandardWOS:Sendra, JRS-
dc.contributor.wosstandardWOS:Silva, SML-
dc.contributor.wosstandardWOS:Ramirez, AV-
dc.date.coverdateDiciembre 2003en_US
dc.identifier.conferenceidevents120373-
dc.identifier.ulpgcSíen_US
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.event.eventsstartdate24-06-2003-
crisitem.event.eventsenddate25-06-2003-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0001-5385-792X-
crisitem.author.fullNameSendra Sendra, José Ramón-
Appears in Collections:Actas de congresos
Thumbnail
pdf
Adobe PDF (309,7 kB)
Show simple item record

WEB OF SCIENCETM
Citations

1
checked on Feb 25, 2024

Page view(s)

92
checked on Feb 17, 2024

Download(s)

168
checked on Feb 17, 2024

Google ScholarTM

Check

Altmetric


Share


Export metadata


Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.