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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/56548
DC FieldValueLanguage
dc.contributor.authorKorotov, Sergeyen_US
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherSuarez, Jose Pablo-
dc.date.accessioned2019-09-19T18:11:55Z-
dc.date.available2019-09-19T18:11:55Z-
dc.date.issued2016en_US
dc.identifier.issn0377-0427en_US
dc.identifier.otherDialnet
dc.identifier.urihttp://hdl.handle.net/10553/56548-
dc.description.abstractIn this paper we survey all known (including own recent results) properties of the longest-edge nn-section algorithms. These algorithms (in classical and recently designed conforming form) are nowadays used in many applications, including finite element simulations, computer graphics, etc. as a reliable tool for controllable mesh generation. In addition, we present a list of open problems arising in and around this topic.en_US
dc.languageengen_US
dc.relation.ispartofJournal of Computational and Applied Mathematicsen_US
dc.sourceJournal of computational and applied mathematics [ISSN 0377-0427], v. 293 (1), p. 139-146en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherLongest-edgen-section algorithmen_US
dc.subject.otherSimplicial partitionen_US
dc.subject.otherAngle conditionsen_US
dc.subject.otherFinite element methoden_US
dc.subject.otherMesh refinementen_US
dc.subject.otherMesh regularityen_US
dc.titleLongest-edge n-section algorithms : properties and open problemsen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.cam.2015.03.046en_US
dc.identifier.scopus84941260857-
dc.identifier.isi000362383400013-
dc.identifier.urlhttp://dialnet.unirioja.es/servlet/articulo?codigo=5327883-
dcterms.isPartOfJournal Of Computational And Applied Mathematics-
dcterms.sourceJournal Of Computational And Applied Mathematics[ISSN 0377-0427],v. 293, p. 139-146-
dc.contributor.authorscopusid6603451369-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid7202040282-
dc.identifier.eissn1879-1778-
dc.description.lastpage146-
dc.identifier.issue1-
dc.description.firstpage139-
dc.relation.volume293-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000362383400013-
dc.contributor.daisngid618611-
dc.contributor.daisngid259483-
dc.contributor.daisngid1080382-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDNo ID-
dc.identifier.externalWOS:000362383400013-
dc.contributor.authordialnetidNo ID-
dc.contributor.authordialnetid101951-
dc.contributor.authordialnetid790514-
dc.identifier.dialnet5327883ARTREV-
dc.identifier.ulpgcSíes
dc.description.sjr1,08
dc.description.jcr1,357
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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