Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/56177
DC FieldValueLanguage
dc.contributor.authorGómez Déniz, Luisen_US
dc.contributor.authorOspina, Raydonalen_US
dc.contributor.authorC. Frery, Alejandroen_US
dc.date.accessioned2019-07-23T09:41:41Z-
dc.date.available2019-07-23T09:41:41Z-
dc.date.issued2019en_US
dc.identifier.issn2072-4292en_US
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/56177-
dc.description.abstractThe M estimator is a recently proposed image-quality index used to evaluate the despeckling operation in SAR (Synthetic Aperture Radar) data. It is used also to rank despeckling filters and to improve their design. As a difference with traditional image-quality estimators, it operates not on the filtered result but on a derived one, i.e., the ratio image. However, a deep statistical analysis of its properties remains open and, with it, the ability to use it as a test statistic. In this work, we focus on obtaining insights into its distribution as well as on exploring other remarkable statistical properties of this unassisted estimator. This study is performed through EDA (Exploratory Data Analysis) and the well-known ANOVA (ANalysis Of VAriance). We test our results on a set of simulated SAR data and provide guides to enrich theMestimator to extend its capabilities.en_US
dc.languageengen_US
dc.relationNuevos Modelos Matemáticos Para la Segmentación y Clasificación en Imágenesen_US
dc.relation.ispartofRemote Sensingen_US
dc.sourceRemote Sensing [ISSN 2072-4292], v. 11 (4), p. 385en_US
dc.subject1209 Estadísticaen_US
dc.subject.otherSpeckleen_US
dc.subject.otherSARen_US
dc.subject.otherDespecklingen_US
dc.subject.otherImage-quality indexen_US
dc.subject.otherM estimatoren_US
dc.subject.otherANOVAen_US
dc.titleStatistical properties of an unassisted image quality index for SAR imageryen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/rs11040385en_US
dc.identifier.scopus85062521061-
dc.identifier.isi000460766100015-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.authorscopusid56789548300-
dc.contributor.authorscopusid23009700500-
dc.contributor.authorscopusid7003561251-
dc.identifier.issue4-
dc.description.firstpage385en_US
dc.relation.volume11en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid746480-
dc.contributor.daisngid3038242-
dc.contributor.daisngid215914-
dc.description.numberofpages16en_US
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Gomez, L-
dc.contributor.wosstandardWOS:Ospina, R-
dc.contributor.wosstandardWOS:Frery, AC-
dc.date.coverdateFebrero 2019en_US
dc.identifier.ulpgces
dc.description.sjr1,422
dc.description.jcr4,509
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.orcid0000-0002-8002-5341-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.fullNameGómez Déniz, Luis-
crisitem.author.fullNameC. Frery, Alejandro-
crisitem.project.principalinvestigatorÁlvarez León, Luis Miguel-
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