Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/55436
Title: Analysis of single event transients in conventional LNA topologies and radiation hardening approaches
Authors: San Miguel Montesdeoca, Mario
Mateos Angulo, Sergio
Khemchandani, S. L. 
Del Pino, J. 
UNESCO Clasification: 33 Ciencias tecnológicas
Issue Date: 2017
URI: http://hdl.handle.net/10553/55436
Source: Biannual European - Latin American Summer School on Design, Test and Reliability (Internacional). Rotterdam, The Netherlands
Appears in Collections:Póster de congreso
Show full item record

Google ScholarTM

Check


Share



Export metadata



Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.