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Title: Analysis of single event transients in conventional LNA topologies and radiation hardening approaches
Authors: San Miguel Montesdeoca, Mario
Mateos Angulo, Sergio
Khemchandani, S. L. 
Del Pino, J. 
Keywords: 33 Ciencias tecnológicas
Issue Date: 2017
Source: Biannual European - Latin American Summer School on Design, Test and Reliability (Internacional). Rotterdam, The Netherlands
Appears in Collections:Póster de congreso

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