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Title: Single-Event Effects Analysis Using TCAD and Circuit Domain Combined Simulations
Authors: Mateos Angulo, Sergio
San Miguel Montesdeoca, Mario
Khemchandani, S. L. 
Del Pino, J. 
Keywords: 33 Ciencias tecnológicas
Issue Date: 2017
Source: Biannual European - Latin American Summer School on Design,Test and Reliability (Internacional). Rotterdam, The Netherlands
Appears in Collections:Póster de congreso

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