Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/55435
| Title: | Single-Event Effects Analysis Using TCAD and Circuit Domain Combined Simulations | Authors: | Mateos Angulo, Sergio San Miguel Montesdeoca, Mario Khemchandani, S. L. Del Pino, J. |
UNESCO Clasification: | 33 Ciencias tecnológicas | Issue Date: | 2017 | URI: | http://hdl.handle.net/10553/55435 | Source: | Biannual European - Latin American Summer School on Design,Test and Reliability (Internacional). Rotterdam, The Netherlands |
| Appears in Collections: | Póster de congreso |
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