Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/55016
DC FieldValueLanguage
dc.contributor.authorFabelo, Himar-
dc.contributor.authorOrtega, Samuel-
dc.contributor.authorCasselden, Elizabeth-
dc.contributor.authorLoh, Jane-
dc.contributor.authorBulstrode, Harry-
dc.contributor.authorZolnourian, Ardalan-
dc.contributor.authorGrundy, Paul-
dc.contributor.authorCallico, Gustavo M.-
dc.contributor.authorBulters, Diederik-
dc.contributor.authorSarmiento, Roberto-
dc.date.accessioned2019-02-18T16:09:15Z-
dc.date.available2019-02-18T16:09:15Z-
dc.date.issued2018-
dc.identifier.issn1424-8220-
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/55016-
dc.description.abstractThe work presented in this paper is focused on the use of spectroscopy to identify the type of tissue of human brain samples employing support vector machine classifiers. Two different spectrometers were used to acquire infrared spectroscopic signatures in the wavenumber range between 1200-3500 cm(-1). An extensive analysis was performed to find the optimal configuration for a support vector machine classifier and determine the most relevant regions of the spectra for this particular application. The results demonstrate that the developed algorithm is robust enough to classify the infrared spectroscopic data of human brain tissue at three different discrimination levels.-
dc.publisher1424-8220-
dc.relation.ispartofSensors-
dc.sourceSensors (Switzerland)[ISSN 1424-8220],v. 18 (4487)-
dc.subject.otherCancer-Detection-
dc.subject.otherClassification-
dc.subject.otherDiagnosis-
dc.subject.otherGliomas-
dc.subject.otherTissue-
dc.subject.otherForest-
dc.subject.otherCells-
dc.subject.otherSpectroscopy-
dc.subject.otherTissue Diagnostics-
dc.subject.otherMedical Imaging-
dc.subject.otherSupport Vector Machines-
dc.subject.otherBrain Cancer-
dc.titleSVM optimization for brain tumor identification using infrared spectroscopic samples-
dc.typeinfo:eu-repo/semantics/article-
dc.typeArticle-
dc.identifier.doi10.3390/s18124487-
dc.identifier.scopus85058888221-
dc.identifier.isi000454817100406-
dc.contributor.authorscopusid56405568500-
dc.contributor.authorscopusid57189334144-
dc.contributor.authorscopusid56309921100-
dc.contributor.authorscopusid57205166424-
dc.contributor.authorscopusid48861007100-
dc.contributor.authorscopusid36705390800-
dc.contributor.authorscopusid8429775300-
dc.contributor.authorscopusid56006321500-
dc.contributor.authorscopusid23018247600-
dc.contributor.authorscopusid35609452100-
dc.identifier.issue4487-
dc.relation.volume18-
dc.type2Artículo-
dc.contributor.daisngid2096372-
dc.contributor.daisngid1812298-
dc.contributor.daisngid5309358-
dc.contributor.daisngid14818349-
dc.contributor.daisngid2234357-
dc.contributor.daisngid4185107-
dc.contributor.daisngid1310916-
dc.contributor.daisngid506422-
dc.contributor.daisngid740967-
dc.contributor.daisngid116294-
dc.description.numberofpages15-
dc.utils.revisionNo-
dc.contributor.wosstandardWOS:Fabelo, H-
dc.contributor.wosstandardWOS:Ortega, S-
dc.contributor.wosstandardWOS:Casselden, E-
dc.contributor.wosstandardWOS:Loh, J-
dc.contributor.wosstandardWOS:Bulstrode, H-
dc.contributor.wosstandardWOS:Zolnourian, A-
dc.contributor.wosstandardWOS:Grundy, P-
dc.contributor.wosstandardWOS:Callico, GM-
dc.contributor.wosstandardWOS:Bulters, D-
dc.contributor.wosstandardWOS:Sarmiento, R-
dc.date.coverdateDiciembre 2018-
dc.identifier.ulpgces
dc.description.sjr0,592
dc.description.jcr3,031
dc.description.sjrqQ2
dc.description.jcrqQ2
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-9794-490X-
crisitem.author.orcid0000-0002-7519-954X-
crisitem.author.orcid0000-0002-3784-5504-
crisitem.author.orcid0000-0002-4843-0507-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameFabelo Gómez, Himar Antonio-
crisitem.author.fullNameOrtega Sarmiento,Samuel-
crisitem.author.fullNameMarrero Callicó, Gustavo Iván-
crisitem.author.fullNameSarmiento Rodríguez, Roberto-
Appears in Collections:Artículos
Show simple item record

SCOPUSTM   
Citations

8
checked on Jul 21, 2024

WEB OF SCIENCETM
Citations

8
checked on Jul 21, 2024

Page view(s)

62
checked on May 23, 2024

Google ScholarTM

Check

Altmetric


Share



Export metadata



Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.