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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54997
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dc.contributor.authorLentaris, George
dc.contributor.authorMaragos, Konstantinos
dc.contributor.authorSoudris, Dimitrios
dc.contributor.authorDi Capua, Francesco
dc.contributor.authorCampajola, Luigi
dc.contributor.authorCampajola, Marcello
dc.contributor.authorCostantino, Alessandra
dc.contributor.authorFurano, Gianluca
dc.contributor.authorTavoularis, Antonios
dc.contributor.authorSantos, Lucana
dc.date.accessioned2019-02-18T16:04:12Z-
dc.date.available2019-02-18T16:04:12Z-
dc.date.issued2019
dc.identifier.issn0018-9499
dc.identifier.urihttp://hdl.handle.net/10553/54997-
dc.publisher0018-9499
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.sourceIEEE Transactions on Nuclear Science[ISSN 0018-9499],v. 66 (8570836), p. 312-319
dc.titleTID evaluation system with on-chip electron source and programmable sensing mechanisms on FPGA
dc.typeinfo:eu-repo/semantics/article
dc.typeArticle
dc.identifier.doi10.1109/TNS.2018.2885713
dc.identifier.scopus85058187459
dc.contributor.authorscopusid23987718500
dc.contributor.authorscopusid15071265400
dc.contributor.authorscopusid7003680549
dc.contributor.authorscopusid56729190900
dc.contributor.authorscopusid6701377662
dc.contributor.authorscopusid57201115046
dc.contributor.authorscopusid56428781300
dc.contributor.authorscopusid6603825057
dc.contributor.authorscopusid57204965999
dc.contributor.authorscopusid54391653200
dc.description.lastpage319
dc.identifier.issue8570836
dc.description.firstpage312
dc.relation.volume66
dc.type2Artículo
dc.identifier.ulpgcSíes
dc.description.sjr0,604
dc.description.jcr1,575
dc.description.sjrqQ2
dc.description.jcrqQ2
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.fullNameSantos Falcón, Lucana-
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