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Please use this identifier to cite or link to this item: https://accedacris.ulpgc.es/handle/10553/54499
DC FieldValueLanguage
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorMárquez, Albertoen_US
dc.contributor.authorMoreno-González, Auxiliadoraen_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.otherMarquez, Alberto-
dc.contributor.otherSuarez, Jose Pablo-
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherMoreno Gonzalez, Maria Auxiliadora-
dc.date.accessioned2019-02-18T11:12:06Z-
dc.date.available2019-02-18T11:12:06Z-
dc.date.issued2009en_US
dc.identifier.issn0378-4754en_US
dc.identifier.urihttps://accedacris.ulpgc.es/handle/10553/54499-
dc.description.abstractThe triangle longest-edge bisection constitutes an efficient scheme for refining a mesh by reducing the obtuse triangles, since the largest interior angles are subdivided. In this paper we specifically introduce a new local refinement for triangulations based on the longest-edge trisection, the 7-triangle longest-edge (7T-LE) local refinement algorithm. Each triangle to be refined is subdivided in seven sub-triangles by determining its longest edge. The conformity of the new mesh is assured by an automatic point insertion criterion using the oriented 1-skeleton graph of the triangulation and three partial division patterns.en_US
dc.languageengen_US
dc.relation.ispartofMathematics and Computers in Simulationen_US
dc.sourceMathematics and Computers in Simulation [ISSN 0378-4754], v. 79, p. 2444-2457en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherLocal refinementen_US
dc.subject.otherLongest-edge based algorithmsen_US
dc.subject.otherSkeletonen_US
dc.titleLocal refinement based on the 7-triangle longest-edge partitionen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.relation.conference6th Meeting on Applied Scientific Computing and Tools (MASCOT06)
dc.identifier.doi10.1016/j.matcom.2009.01.009
dc.identifier.scopus63449116063-
dc.identifier.isi000265717400014-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid7102678794-
dc.contributor.authorscopusid16550374900-
dc.contributor.authorscopusid7202040282-
dc.description.lastpage2457-
dc.description.firstpage2444-
dc.relation.volume79-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000265717400014-
dc.contributor.daisngid259483-
dc.contributor.daisngid710426-
dc.contributor.daisngid5156009-
dc.contributor.daisngid1080382-
dc.identifier.investigatorRIDC-6905-2011-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDNo ID-
dc.identifier.externalWOS:000265717400014-
dc.identifier.externalWOS:000265717400014-
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Marquez, A
dc.contributor.wosstandardWOS:Moreno-Gonzalez, A
dc.contributor.wosstandardWOS:Suarez, JP
dc.date.coverdateAbril 2009
dc.identifier.conferenceidevents120669
dc.identifier.ulpgcSíes
dc.description.jcr0,946
dc.description.jcrqQ2
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.event.eventsstartdate05-10-2006-
crisitem.event.eventsenddate07-10-2006-
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