Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54467
DC FieldValueLanguage
dc.contributor.authorMárquez, Albertoen_US
dc.contributor.authorMoreno-González, Auxiliadoraen_US
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.otherSuarez, Jose Pablo-
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherMarquez, Alberto-
dc.contributor.otherMoreno Gonzalez, Maria Auxiliadora-
dc.date.accessioned2019-02-18T11:00:43Z-
dc.date.available2019-02-18T11:00:43Z-
dc.date.issued2008en_US
dc.identifier.issn0168-874Xen_US
dc.identifier.urihttp://hdl.handle.net/10553/54467-
dc.description.abstractA new triangle partition, the seven-triangle longest-edge partition, based on the trisection of the edges is presented and the associated mesh quality improvement property, discussed. The seven-triangle longest-edge (7T-LE) partition of a triangle t is obtained by putting two equally spaced points per edge. After cutting off three triangles at the corners, the remaining hexagon is subdivided further by joining each point of the longest-edge of t to the base points of the opposite sub-triangle. Finally, the interior quadrangle is subdivided into two sub-triangles by the shortest diagonal. The self-improvement property of the 7T-LE partition is discussed, delimited and compared to the parallel property of the four-triangle longest-edge (4T-LE) partition. Global refinement strategies, combining longest-edge with self-similar partitions, are proposed, based on the theoretical geometrical properties.en_US
dc.languageengen_US
dc.relation.ispartofFinite Elements in Analysis and Designen_US
dc.sourceFinite Elements in Analysis and Design [ISSN 0168-874X], v. 44, p. 748-758en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherRefinementen_US
dc.subject.otherLongest-edge based algorithmsen_US
dc.subject.otherImprovement of mesh qualityen_US
dc.titleThe seven-triangle longest-side partition of triangles and mesh quality improvementen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.finel.2008.04.007
dc.identifier.scopus48649087856-
dc.identifier.isi000258929500004-
dc.contributor.authorscopusid7102678794-
dc.contributor.authorscopusid16550374900-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid7202040282-
dc.description.lastpage758-
dc.description.firstpage748-
dc.relation.volume44-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000258929500004-
dc.contributor.daisngid710426-
dc.contributor.daisngid5156009-
dc.contributor.daisngid259483-
dc.contributor.daisngid1080382-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDC-6905-2011-
dc.identifier.investigatorRIDNo ID-
dc.identifier.externalWOS:000258929500004-
dc.identifier.externalWOS:000258929500004-
dc.contributor.wosstandardWOS:Marquez, A
dc.contributor.wosstandardWOS:Moreno-Gonzalez, A
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Suarez, JP
dc.date.coverdateAgosto 2008
dc.identifier.ulpgces
dc.description.jcr0,989
dc.description.jcrqQ2
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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