Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/54467
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Márquez, Alberto | en_US |
dc.contributor.author | Moreno-González, Auxiliadora | en_US |
dc.contributor.author | Plaza, Ángel | en_US |
dc.contributor.author | Suárez, José P. | en_US |
dc.contributor.other | Suarez, Jose Pablo | - |
dc.contributor.other | PLAZA, ANGEL | - |
dc.contributor.other | Marquez, Alberto | - |
dc.contributor.other | Moreno Gonzalez, Maria Auxiliadora | - |
dc.date.accessioned | 2019-02-18T11:00:43Z | - |
dc.date.available | 2019-02-18T11:00:43Z | - |
dc.date.issued | 2008 | en_US |
dc.identifier.issn | 0168-874X | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/54467 | - |
dc.description.abstract | A new triangle partition, the seven-triangle longest-edge partition, based on the trisection of the edges is presented and the associated mesh quality improvement property, discussed. The seven-triangle longest-edge (7T-LE) partition of a triangle t is obtained by putting two equally spaced points per edge. After cutting off three triangles at the corners, the remaining hexagon is subdivided further by joining each point of the longest-edge of t to the base points of the opposite sub-triangle. Finally, the interior quadrangle is subdivided into two sub-triangles by the shortest diagonal. The self-improvement property of the 7T-LE partition is discussed, delimited and compared to the parallel property of the four-triangle longest-edge (4T-LE) partition. Global refinement strategies, combining longest-edge with self-similar partitions, are proposed, based on the theoretical geometrical properties. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Finite Elements in Analysis and Design | en_US |
dc.source | Finite Elements in Analysis and Design [ISSN 0168-874X], v. 44, p. 748-758 | en_US |
dc.subject | 120601 Construcción de algoritmos | en_US |
dc.subject.other | Refinement | en_US |
dc.subject.other | Longest-edge based algorithms | en_US |
dc.subject.other | Improvement of mesh quality | en_US |
dc.title | The seven-triangle longest-side partition of triangles and mesh quality improvement | en_US |
dc.type | info:eu-repo/semantics/Article | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.finel.2008.04.007 | |
dc.identifier.scopus | 48649087856 | - |
dc.identifier.isi | 000258929500004 | - |
dc.contributor.authorscopusid | 7102678794 | - |
dc.contributor.authorscopusid | 16550374900 | - |
dc.contributor.authorscopusid | 7006613647 | - |
dc.contributor.authorscopusid | 7202040282 | - |
dc.description.lastpage | 758 | - |
dc.description.firstpage | 748 | - |
dc.relation.volume | 44 | - |
dc.investigacion | Ciencias | en_US |
dc.type2 | Artículo | en_US |
dc.identifier.wos | WOS:000258929500004 | - |
dc.contributor.daisngid | 710426 | - |
dc.contributor.daisngid | 5156009 | - |
dc.contributor.daisngid | 259483 | - |
dc.contributor.daisngid | 1080382 | - |
dc.identifier.investigatorRID | C-1092-2012 | - |
dc.identifier.investigatorRID | A-8210-2008 | - |
dc.identifier.investigatorRID | C-6905-2011 | - |
dc.identifier.investigatorRID | No ID | - |
dc.identifier.external | WOS:000258929500004 | - |
dc.identifier.external | WOS:000258929500004 | - |
dc.contributor.wosstandard | WOS:Marquez, A | |
dc.contributor.wosstandard | WOS:Moreno-Gonzalez, A | |
dc.contributor.wosstandard | WOS:Plaza, A | |
dc.contributor.wosstandard | WOS:Suarez, JP | |
dc.date.coverdate | Agosto 2008 | |
dc.identifier.ulpgc | Sí | es |
dc.description.jcr | 0,989 | |
dc.description.jcrq | Q2 | |
dc.description.scie | SCIE | |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Matemáticas | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Cartografía y Expresión Gráfica en La Ingeniería | - |
crisitem.author.orcid | 0000-0002-5077-6531 | - |
crisitem.author.orcid | 0000-0001-8140-9008 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Plaza De La Hoz, Ángel | - |
crisitem.author.fullName | Suárez Rivero, José Pablo | - |
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