Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/54467
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Márquez, Alberto | en_US |
dc.contributor.author | Moreno-González, Auxiliadora | en_US |
dc.contributor.author | Plaza, Ángel | en_US |
dc.contributor.author | Suárez, José P. | en_US |
dc.contributor.other | Suarez, Jose Pablo | - |
dc.contributor.other | PLAZA, ANGEL | - |
dc.contributor.other | Marquez, Alberto | - |
dc.contributor.other | Moreno Gonzalez, Maria Auxiliadora | - |
dc.date.accessioned | 2019-02-18T11:00:43Z | - |
dc.date.available | 2019-02-18T11:00:43Z | - |
dc.date.issued | 2008 | en_US |
dc.identifier.issn | 0168-874X | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/54467 | - |
dc.description.abstract | A new triangle partition, the seven-triangle longest-edge partition, based on the trisection of the edges is presented and the associated mesh quality improvement property, discussed. The seven-triangle longest-edge (7T-LE) partition of a triangle t is obtained by putting two equally spaced points per edge. After cutting off three triangles at the corners, the remaining hexagon is subdivided further by joining each point of the longest-edge of t to the base points of the opposite sub-triangle. Finally, the interior quadrangle is subdivided into two sub-triangles by the shortest diagonal. The self-improvement property of the 7T-LE partition is discussed, delimited and compared to the parallel property of the four-triangle longest-edge (4T-LE) partition. Global refinement strategies, combining longest-edge with self-similar partitions, are proposed, based on the theoretical geometrical properties. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Finite Elements in Analysis and Design | en_US |
dc.source | Finite Elements in Analysis and Design [ISSN 0168-874X], v. 44, p. 748-758 | en_US |
dc.subject | 120601 Construcción de algoritmos | en_US |
dc.subject.other | Refinement | en_US |
dc.subject.other | Longest-edge based algorithms | en_US |
dc.subject.other | Improvement of mesh quality | en_US |
dc.title | The seven-triangle longest-side partition of triangles and mesh quality improvement | en_US |
dc.type | info:eu-repo/semantics/Article | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.finel.2008.04.007 | |
dc.identifier.scopus | 48649087856 | - |
dc.identifier.isi | 000258929500004 | - |
dc.contributor.authorscopusid | 7102678794 | - |
dc.contributor.authorscopusid | 16550374900 | - |
dc.contributor.authorscopusid | 7006613647 | - |
dc.contributor.authorscopusid | 7202040282 | - |
dc.description.lastpage | 758 | - |
dc.description.firstpage | 748 | - |
dc.relation.volume | 44 | - |
dc.investigacion | Ciencias | en_US |
dc.type2 | Artículo | en_US |
dc.identifier.wos | WOS:000258929500004 | - |
dc.contributor.daisngid | 710426 | - |
dc.contributor.daisngid | 5156009 | - |
dc.contributor.daisngid | 259483 | - |
dc.contributor.daisngid | 1080382 | - |
dc.identifier.investigatorRID | C-1092-2012 | - |
dc.identifier.investigatorRID | A-8210-2008 | - |
dc.identifier.investigatorRID | C-6905-2011 | - |
dc.identifier.investigatorRID | No ID | - |
dc.identifier.external | WOS:000258929500004 | - |
dc.identifier.external | WOS:000258929500004 | - |
dc.contributor.wosstandard | WOS:Marquez, A | |
dc.contributor.wosstandard | WOS:Moreno-Gonzalez, A | |
dc.contributor.wosstandard | WOS:Plaza, A | |
dc.contributor.wosstandard | WOS:Suarez, JP | |
dc.date.coverdate | Agosto 2008 | |
dc.identifier.ulpgc | Sí | es |
dc.description.jcr | 0,989 | |
dc.description.jcrq | Q2 | |
dc.description.scie | SCIE | |
item.fulltext | Sin texto completo | - |
item.grantfulltext | none | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Matemáticas | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Cartografía y Expresión Gráfica en La Ingeniería | - |
crisitem.author.orcid | 0000-0002-5077-6531 | - |
crisitem.author.orcid | 0000-0001-8140-9008 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Plaza De La Hoz, Ángel | - |
crisitem.author.fullName | Suárez Rivero, José Pablo | - |
Appears in Collections: | Artículos |
SCOPUSTM
Citations
12
checked on Mar 30, 2025
WEB OF SCIENCETM
Citations
8
checked on Mar 30, 2025
Page view(s)
123
checked on Nov 23, 2024
Google ScholarTM
Check
Altmetric
Share
Export metadata
Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.