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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54466
DC FieldValueLanguage
dc.contributor.authorSuárez, J. P.en_US
dc.contributor.authorPlaza, A.en_US
dc.contributor.authorCarey, G. F.en_US
dc.contributor.otherSuarez, Jose Pablo-
dc.contributor.otherPLAZA, ANGEL-
dc.date.accessioned2019-02-18T11:00:25Z-
dc.date.available2019-02-18T11:00:25Z-
dc.date.issued2008en_US
dc.identifier.issn1069-8299en_US
dc.identifier.urihttp://hdl.handle.net/10553/54466-
dc.description.abstractWe examine the propagation of local adaptive mesh refinement (AMR) under a longest edge conformity scheme. Supporting numerical studies are included and discussed. Of specific interest is the statistical behaviour of the propagation zone in AMR of simplicial meshes. To this end three propagation metrics are used: the total number of original triangles in the propagation paths emanating from any target element, the longest individual edge path, and the extent of secondary refinement due to the conformity.en_US
dc.languageengen_US
dc.relation.ispartofCommunications in Numerical Methods in Engineeringen_US
dc.sourceCommunications in Numerical Methods in Engineering [ISSN 1069-8299], v. 24, p. 543-553en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherAptive mesh refinementen_US
dc.subject.otherLongest edge propagation statisticsen_US
dc.titlePropagation of longest-edge mesh patterns in local adaptive refinementen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/cnm.956
dc.identifier.scopus48249112594-
dc.identifier.isi000258086600001-
dc.contributor.authorscopusid7202040282-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid24517624600-
dc.identifier.eissn1099-0887-
dc.description.lastpage553-
dc.description.firstpage543-
dc.relation.volume24-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000258086600001-
dc.contributor.daisngid1080382-
dc.contributor.daisngid259483-
dc.contributor.daisngid36333-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.externalWOS:000258086600001-
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Carey, GF
dc.date.coverdateJulio 2008
dc.identifier.ulpgcSíes
dc.description.jcr0,756
dc.description.jcrqQ3
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
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