Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/54440
Campo DC Valoridioma
dc.contributor.authorAlvarez, L.en_US
dc.contributor.authorSalgado, A.en_US
dc.contributor.authorSánchez, J.en_US
dc.date.accessioned2019-02-18T10:50:17Z-
dc.date.available2019-02-18T10:50:17Z-
dc.date.issued2007en_US
dc.identifier.issn1054-6618en_US
dc.identifier.urihttp://hdl.handle.net/10553/54440-
dc.description.abstractThe aim of this work is to accurately estimate from an image the parameters of some ellipses and their relative positions with respect to a given pattern. The process is characterized because it is fully automated and is robust against image noise and occlusions. We have built a calibrator pattern with two planes each containing several ordered circles in known 3D positions. Our method is able to estimate the position of every ellipse and to put them into correspondence with the original calibrator circles. © 2007 Pleiades Publishing, Ltd.
dc.languageengen_US
dc.publisher1054-6618-
dc.relation.ispartofPattern Recognition and Image Analysisen_US
dc.sourcePattern Recognition and Image Analysis[ISSN 1054-6618],v. 17, p. 508-522en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject120602 Ecuaciones diferencialesen_US
dc.subject120304 Inteligencia artificialen_US
dc.subject220990 Tratamiento digital. Imágenesen_US
dc.titleRobust detection and ordering of ellipses on a calibration patternen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1134/S1054661807040098
dc.identifier.scopus37249006835-
dc.contributor.authorscopusid55640159000-
dc.contributor.authorscopusid56268272100-
dc.contributor.authorscopusid22735426600-
dc.description.lastpage522-
dc.description.firstpage508-
dc.relation.volume17-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.date.coverdateDiciembre 2007
dc.identifier.ulpgces
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR Modelos Matemáticos-
crisitem.author.deptDepartamento de Informática y Sistemas-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Informática y Sistemas-
crisitem.author.orcid0000-0002-6953-9587-
crisitem.author.orcid0000-0001-8514-4350-
crisitem.author.parentorgDepartamento de Informática y Sistemas-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.fullNameÁlvarez León, Luis Miguel-
crisitem.author.fullNameSánchez Pérez, Javier-
Colección:Artículos
Vista resumida

Google ScholarTM

Verifica

Altmetric


Comparte



Exporta metadatos



Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.